Microscope Slide Reference Marks for 3D Positioning
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Solution Overview
Problem
Current microscope systems lack the accuracy to reproduce observation positions in three-dimensional space, particularly in pathological diagnosis, due to mechanical errors and tilts in the XY stage and slide, which affect the Z-axis focus and overall position management.
Innovation Solution
A microscope system with a slide featuring a label area, cover glass area, position reference marks, and focus reference marks to specify orthogonal X-axis, Y-axis, and Z-axis directions, along with a control system for adjusting stage positions and an imaging unit for capturing and displaying images, enabling precise position management and correction of tilts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If mechanical accuracy of the XY stage and slide is used for position management, then ease of operation is improved, but measurement precision deteriorates due to tilts and mechanical errors
Solution Approach 1:
The patent introduces reference marks (position reference marks and focus reference marks) as intermediary elements that mediate between the mechanical stage system and the measurement system. These marks provide a stable reference framework that is independent of mechanical tilts and errors, allowing accurate measurement of observation positions without being affected by the mechanical inaccuracies of the XY stage or slide.
Solution Approach 2:
The patent replaces reliance on mechanical accuracy with an optical/reference-based measurement system. Instead of depending on the mechanical precision of the stage and slide (which suffers from tilts and errors), the system uses reference marks that can be detected optically or measured relatively, substituting the mechanical measurement approach with a reference-based approach that is immune to mechanical imperfections.
2Measurement precision
If Z stage operation is added for high-magnification observation, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent performs preliminary actions by pre-positioning reference marks on the slide and cover glass before observation begins. The position reference marks and focus reference marks are arranged in advance to establish a known reference framework. This preliminary setup eliminates the need for complex real-time Z-stage operations during high-magnification observation, as the reference marks provide pre-established positional information that simplifies the measurement process.
3Measurement precision
If reference marks are added to the slide, then measurement precision is improved, but manufacturing precision requirements increase
Solution Approach 1:
The patent segments the reference mark system into two distinct components: position reference marks that specify X and Y axis directions, and focus reference marks that specify the Z axis direction. This segmentation allows each type of mark to be optimized independently for its specific function. The position reference marks can be manufactured with standard precision for defining planar coordinates, while the focus reference marks are designed specifically for depth indication, reducing the overall manufacturing precision burden compared to a single integrated reference system.
Data Source
AI summary
A slide used for observation by a microscope includes a label area configured to arrange a label, a cover glass area configured to arrange an observation object and a cover glass, a position reference mark arranged in a vacant area between the label area and the cover glass area and configured to specify a reference position of the slide and an X-axis direction and a Y-axis direction that are orthogonal to each other, and focus reference marks in which a predetermined pattern is repetitively arranged along two opposing sides of four sides of a periphery of the cover glass area, the focus reference marks being configured to specify a Z-axis direction orthogonal to the X-axis direction and the Y-axis direction.