Microscope XY Stage Scale Plate Positioning
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Solution Overview
Problem
Current microscope systems lack the accuracy to reproduce observation positions and still image capturing positions required for precise pathological diagnosis, due to coarse coordinate measurement methods and mechanical errors in stage movement.
Innovation Solution
A microscope system with an XY two-dimensional scale plate and sensors that provide direct and accurate X- and Y-coordinate measurements, along with a ΔΘ stage for rotational error correction, ensuring precise position management and alignment between the stage and digital camera.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional coordinate measurement methods are used in microscope systems, then the system structure remains simple, but the position measurement accuracy is insufficient for pathological diagnosis
Solution Approach 1:
The patent replaces conventional mechanical coordinate measurement methods with an optical measurement system. A scale plate with artificial markers is introduced, and its position is measured optically by a camera system rather than mechanically, achieving sub-micrometer accuracy while maintaining manageable system complexity through optical field measurement techniques
Solution Approach 2:
The patent introduces a scale plate with artificial markers as an intermediary measurement medium. This scale plate serves as a mediator between the physical stage position and the digital coordinate system, enabling precise position measurement through optical recognition of the markers rather than direct mechanical sensing
2Reliability
If manual stage operation is used, then the system remains simple to operate, but the reproduction accuracy of observation positions is insufficient
Solution Approach 1:
The patent implements a feedback mechanism where the actual stage position is continuously measured by the optical system and fed back to the control unit. The control unit then adjusts the stage position based on this feedback to achieve the target observation position, enabling accurate position reproduction through closed-loop control rather than open-loop manual operation
Solution Approach 2:
The patent replaces manual mechanical stage operation with an automated motor-driven stage controlled by a control unit. The stage position is precisely controlled through electrical signals based on optical measurement feedback, eliminating the imprecision of manual operation while maintaining ease of use through automated control interfaces
3Measurement precision
If separate observation of morphological and functional images is performed, then the diagnostic process remains simple, but the alignment accuracy between images is insufficient
Solution Approach 1:
The patent uses artificial markers embedded in the scale plate as intermediaries for image alignment. These markers appear in both morphological and functional images, serving as reference points that enable the control unit to calculate transformation matrices and accurately align the two types of images through coordinate system transformation
Solution Approach 2:
The patent implements a feedback-based alignment process where the positions of artificial markers are detected in both morphological and functional images, and the control unit uses this information to calculate and apply coordinate transformation matrices. This feedback loop ensures accurate alignment by continuously referencing the known marker positions
Data Source
AI summary
A microscope system includes a microscope body, an XY stage mounted on the microscope body and including a stage configured to place a slide as an observation target and move in an X-axis direction and a Y-axis direction perpendicular to each other, and an XY two-dimensional scale plate fixed to the stage. The XY two-dimensional scale plate is provided with a first mark that provides axis information in the X-axis direction throughout a movable range of the stage in the Y-axis direction and a second mark that provides axis information in the Y-axis direction throughout a movable range of the stage in the X-axis direction, which are used to recognize X- and Y-coordinates of the stage.