Microscope Stage Tilt Correction for Pathological Image Alignment

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Solution Overview

Problem

Current microscope systems lack the accuracy to manage and reproduce the position of the stage surface in the optical axis direction, leading to difficulties in pathological diagnosis due to mechanical errors and tilt issues, which result in coarse coordinate reading and inability to correctly align morphological and functional images.

Innovation Solution

A microscope system with a ΔZ stage and ΔΘ stage that corrects the tilt of the stage and slide with respect to the optical axis, using precise scales and sensors to achieve accurate position management in the X, Y, and Z directions, enabling precise alignment and reproduction of observation positions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional microscope systems with manual or basic motor-driven stages are used, then the device complexity is low and ease of operation is maintained, but the position management accuracy in the optical axis direction is insufficient due to mechanical errors and tilt issues

Engineering Contradiction:
Improveposition management accuracyVSAvoidstage correction mechanism complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces manual mechanical stage adjustment with an automated correction system that uses sensors to detect tilt and position errors, then uses drive mechanisms to automatically correct the stage position in the optical axis direction, substituting mechanical precision requirements with sensor-based detection and control

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent implements a feedback mechanism where sensors continuously monitor the stage surface tilt and position relative to the optical axis, and this information is used to drive correction mechanisms that adjust the stage position, creating a closed-loop control system that maintains accurate positioning

Inventive Principle:
Principle #23Feedback

2Measurement precision

If high-magnification observation is performed without Z stage correction, then the operation is simpler, but the observation accuracy deteriorates because the tissue slice shifts from focus position due to XY stage tilt

Engineering Contradiction:
Improveobservation accuracyVSAvoidoperation complexity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent performs preliminary correction of the XY stage tilt and position before high-magnification observation begins, using sensors to detect and correct any misalignment in advance, so that the stage is properly positioned and the tissue slice remains in focus during observation without requiring complex real-time adjustments

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If morphological and functional images are captured without precise position management, then the imaging process is faster, but the image alignment accuracy is insufficient for accurate pathological diagnosis

Engineering Contradiction:
Improveimage alignment accuracyVSAvoidimaging speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent uses position sensors to provide feedback on the exact stage position when capturing morphological and functional images, allowing the system to automatically align and register images from different magnifications and staining types with high precision, ensuring accurate overlay and comparison for pathological diagnosis

Inventive Principle:
Principle #23Feedback

Data Source

PatentEP3387479B1Microscope system and method of controlling the same
Publication Date: 2022.04.13 CANON KK
  • EP3387479B1 patent drawingFigure 1
  • EP3387479B1 patent drawingFigure 2
  • EP3387479B1 patent drawingFigure 3

AI summary

A microscope system includes an observation optical system including an objective lens, an XY stage capable of moving an XY plane in an X-axis direction and an Y-axis direction, a first change unit configured to change a slant of the XY plane with respect to an optical axis direction of the objective lens, and a second change unit configured to change a slant of a slide placed on the XY stage with respect to the XY plane. Changing the slant of the XY plane by the first change unit is performed based on a first mark arranged on the XY plane at a position observable by the observation optical system. Changing the slant of the slide with respect to the XY plane by the second change unit is performed based on a second mark arranged on the slide.