Microscope Targeting Light Pattern for Direct Subject Alignment
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Solution Overview
Problem
Microscope users face challenges in locating specific features visible without magnification within a magnified view, as existing methods require time-consuming objective-swapping and re-focusing, and may not be efficient when the desired magnification is only slightly higher than the initial spotting magnification.
Innovation Solution
A light pattern, such as a spot or cross, is projected onto the microscope stage, visible under direct examination, to align the illuminated area within the microscope's enlarged field of view, with an auto-extinguishing feature to prevent distraction during examination, using lasers or other light sources with adjustable intensity and angle, and optical arrangements like beamsplitters or line-generator lenses to maintain alignment regardless of subject distance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If objective-swapping and re-focusing methods are used to locate features under magnification, then the desired feature can be found in the magnified field of view, but time is wasted on repeated adjustments and re-centering
Solution Approach 1:
The patent projects a targeting light pattern (crosshairs or spot) onto the subject before magnified examination begins. This preliminary visual marker indicates exactly where the magnified field of view will be centered, eliminating the need for iterative objective-swapping and re-centering. The operator simply positions the subject so the target feature aligns with the projected light pattern, then switches to magnification directly.
Solution Approach 2:
The patent introduces a light projection system as an intermediary between the operator and the subject. This intermediary device projects visible light patterns that serve as a bridge, allowing the operator to see both the macro position and the intended micro field of view simultaneously. The light pattern acts as a mediator that guides precise positioning without requiring multiple magnification changes.
2Measurement precision
If multiple magnification objectives are provided to locate and examine features, then the desired area can be centered and examined under increased magnification, but the process requires progressive swapping of objectives
Solution Approach 1:
The patent extracts the targeting function from the magnification system itself. Instead of relying on multiple objectives to provide both spotting and examination capabilities, the invention separates these functions by using a dedicated light projection system for targeting while using a single magnification objective for examination. This eliminates the need for objective swapping while maintaining precise field of view control.
3Measurement precision
If continuous targeting light is used during subject examination, then alignment is maintained, but the light becomes distracting and unsuitable for detailed examination
Solution Approach 1:
The patent implements automatic or manual control to turn off the targeting light once the subject is positioned and magnified examination begins. The light operates periodically—on during positioning, off during examination—rather than continuously. This eliminates visual distraction while maintaining alignment accuracy, as the light is only active when needed for positioning the field of view.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables rapid and precise alignment of the subject, reducing time wasted on objective-swapping and re-focusing, and allows for direct-vision alignment, improving efficiency in positioning and identifying features under magnification.
Implementation Method 1
A light pattern, such as a spot or cross, is projected onto the microscope stage, visible under direct examination
Implementation Method 2
The desired area to examine is located and centered in the field of view under a low magnification, then progressively higher magnification objectives are swapped in
Data Source
AI summary
A microscope subject illumination system including a position targeting accessory that identifies a point on a subject by a distinctive illumination pattern cast on the subject. The system includes an automatic control to switch between illumination sources so that the distinctive pattern is easier to discern during subject positioning. The control may automatically extinguish the targeting illumination after a configurable period of time.