Microscope Variable Sensor Field of View
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Solution Overview
Problem
Existing microscopy methods lack flexibility and efficiency in quickly examining large samples with varying levels of detail, requiring frequent changes in objective lenses and resolution, which impairs image quality and increases examination time.
Innovation Solution
A method and microscope system that allows for a variable image-sensor-side field of view by selecting specific sections of the image sensor, enabling adaptable portion-imaging fields of view and resolutions for efficient examination of large samples without changing the objective, using a digital microscope with an electronic image conversion and processing, and an actuator for extended depth of field and depth information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the field of view is reduced to increase resolution, then image quality is improved, but examination time increases due to the need to scan multiple regions
Solution Approach 1:
The patent applies dynamic adaptation by automatically adjusting the field of view and resolution based on the detected region of interest. The system dynamically switches between overview mode (larger field of view) and detailed examination mode (smaller field of view with higher resolution) without requiring manual intervention or multiple fixed scans, thereby resolving the contradiction between resolution and examination time.
Solution Approach 2:
The patent implements local quality enhancement by applying high resolution and detailed imaging only to the detected region of interest, while maintaining a larger field of view for the rest of the sample. This selective application of high resolution to only where needed reduces the total examination time while maintaining image quality where it matters most.
2Area of stationary object
If the objective lens is changed to adjust magnification, then field of view is improved, but device complexity increases
Solution Approach 1:
The patent makes the image sensor universal by enabling it to perform multiple functions: capturing both wide-field overview images and high-magnification detailed images without requiring physical changes to the optical path. The sensor adapts its effective field of view through electronic selection of active pixel regions, eliminating the need for multiple objective lenses or mechanical changes.
Solution Approach 2:
The patent replaces the mechanical system of changing objective lenses with an electronic system that selects and activates different regions of the image sensor. This substitution eliminates mechanical complexity while achieving the same functional result of varying field of view and magnification.
3Measurement precision
If the resolution is increased for detailed examination, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The patent applies partial action by using high resolution only for the detected region of interest rather than for the entire sample. The system performs a preliminary low-resolution scan to locate the region of interest, then concentrates high-resolution imaging only where needed, thereby maintaining measurement precision while significantly improving overall examination speed and productivity.
Solution Approach 2:
The patent performs preliminary action by conducting an initial overview scan at lower resolution to detect and locate the region of interest before initiating high-resolution imaging. This preliminary step prevents wasted time capturing high-resolution data in areas that do not require detailed examination, thereby improving productivity while maintaining measurement precision where necessary.
Data Source
AI summary
The present invention relates to a method for viewing a specimen using a microscope which comprises an objective lens and an image sensor for converting an image formed on the image sensor by the objective lens. A field of view of the microscope can be varied by selecting a section of the image sensor. In one step of the method, an initial image of at least a partial section of the specimen is captured with the microscope, for which a first field of view is selected on the microscope. The initial image is analyzed to determine at least two differing fields of view forming a partial area image, wherein a partial area of the initial image is formed by each of the fields of view forming a partial area image. Images of the partial areas of the specimen are captured for each of the determined fields of view forming a partial area image. The invention further relates to a microscope for viewing a specimen using a microscope.