Microscope Wave Separation for Multilayer Sample Imaging
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Solution Overview
Problem
In membrane type holders, electron beams penetrate through multiple layers, superimposing signals from membranes onto the sample, degrading image quality, especially for ultra-high accurate measurements of small reaction fields in catalysts and electrodes.
Innovation Solution
A microscope system that deflects and separates electron beams through multiple layers, using a control device to calculate amplitudes and phases of electron waves from each layer, improving image quality by separating electron wave information from each layer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a membrane type holder is used to introduce atmospheric gas or liquid into the holder, then the ability to perform in-situ observation is improved, but the image quality of the sample is degraded due to signal superposition from membranes
Solution Approach 1:
The patent applies segmentation by dividing the electron wave information from multiple layers (membranes and sample) into separate components. Through focal position changes and amplitude/phase calculations, the electron waves are segmented into distinct layer-specific information, allowing the sample signal to be isolated from membrane signals and thus improving image quality while maintaining in-situ observation capability
Solution Approach 2:
The patent extracts the harmful membrane signals from the superimposed electron wave information. By calculating amplitudes and phases at different focal positions and separating the electron wave information by layer, the method effectively extracts and removes the membrane-contributed signals, leaving only the pure sample signal for high-quality imaging
2Reliability
If electron beam penetrates through multiple layers including membranes and sample, then the holder structure can be maintained, but the reaction fields affecting chemical reactions cannot be measured with ultra-high accuracy
Solution Approach 1:
The patent segments the electron wave information into layer-specific components through focal position variation and amplitude/phase calculation. This segmentation allows the extremely small reaction field signals from catalysts and electrodes to be isolated from the larger membrane signals, enabling ultra-high accurate measurements while maintaining the holder's structural integrity
Solution Approach 2:
The patent extracts the weak reaction field signals from the superimposed electron waves by separating information from different layers. Through mathematical calculation of amplitudes and phases at different focal positions, the method extracts the subtle reaction field effects that would otherwise be buried in the membrane signals, achieving the required measurement precision
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances image quality by accurately separating electron waves from each layer, particularly for catalysts and electrodes, enabling high-precision analysis.
Implementation Method 1
a microscope which deflects an electron beam incident on a first layer, a second layer, and a third layer to acquire multiple pieces of electron wave information
Implementation Method 2
a control device which changes a focal position of the multiple pieces of electron wave information acquired by the microscope to the third layer, and calculates the amplitudes and phases of electron waves originating from the first layer, the second layer, and the third layer
Data Source
AI summary
An object of the present invention is to provide a microscope system capable of separating electron waves acquired by a microscope and having passed through multiple layers including a sample into electron wave information originating from each layer, thereby improving the image quality of the sample to be observed. The microscope system of the present invention includes: a microscope which deflects an electron beam incident on a first layer, a second layer, and a third layer to acquire multiple pieces of electron wave information; and a control device which changes a focal position of the multiple pieces of electron wave information acquired by the microscope to the third layer, and calculates the amplitudes and phases of electron waves originating from the first layer, the second layer, and the third layer, respectively based on the amplitudes and phases included in the electron wave information after the focal position is changed.