Microscope Zoom Level Extraction via Image Tracking

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Solution Overview

Problem

Optical microscopes lack an efficient method to accurately determine and provide the current zoom level to microscope applications, affecting the precision and functionality of associated tools and features.

Innovation Solution

A system and method that captures reference images, compares them to current images to determine the zoom level, using a processor and machine-readable medium to record and communicate the zoom level to microscope applications, enabling accurate magnification tracking.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If optical microscopes use a system of lenses to magnify the specimen across a range of zoom levels, then the versatility and adaptability of the microscope is improved, but the ability to accurately determine and provide the current zoom level to applications deteriorates

Engineering Contradiction:
Improvezoom level adjustmentVSAvoidzoom level determination
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent creates a digital copy of the specimen image at different zoom levels and compares these copied images to determine the current zoom level. By capturing reference images at known zoom levels and comparing them with current images through image processing, the system can accurately identify the current magnification without adding physical measurement components to the optical path.

Inventive Principle:
Principle #26Copying

2Adaptability or versatility

If the microscope provides zoom level information to microscope applications, then the functionality and precision of associated tools is improved, but the device complexity increases

Engineering Contradiction:
Improveapplication integrationVSAvoidzoom level extraction system
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The image capture system serves multiple functions: it captures the specimen image for viewing and simultaneously captures the same image for zoom level determination through comparison with reference images. This multi-functional approach allows the microscope to provide zoom level information to applications without requiring separate dedicated measurement hardware, thereby limiting the increase in device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If the microscope accurately tracks magnification for tool tracking and calibration, then the measurement precision and reliability is improved, but the loss of time for image capture and processing increases

Engineering Contradiction:
Improvemagnification tracking accuracyVSAvoidimage capture and processing time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system performs preliminary action by capturing and storing reference images at known zoom levels before actual measurement or calibration tasks. When zoom level determination is needed, the system compares current images against these pre-prepared references, significantly reducing the time required for accurate magnification tracking during critical operations like tool tracking and calibration.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10409051B2Extraction of microscope zoom level using object tracking
Publication Date: 2019.09.10 ALCON INC
  • US10409051B2 patent drawing
  • US10409051B2 patent drawing
  • US10409051B2 patent drawing

AI summary

A method and system for extracting the zoom level of a microscope is disclosed. The method includes capturing a reference image; recording a first zoom level corresponding to a first magnification at which the reference image is captured; capturing a second image; determining a second zoom level by comparing the second image and the reference image, the second zoom level corresponding to a second magnification at which the second image is captured; and recording the second zoom level at a location accessible by a microscope application.