Multi-spot Laser Scanning Microscope Zoom Control
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional laser scanning microscopes face limitations in achieving finely graduated zoom stages with predetermined pixel resolution, particularly when zooming in or out of fields with specific pixel sizes, such as 512×512 pixels, due to restrictions in the number of available zoom stages and the inability to uniformly scan fields of varying sizes without crosstalk or loss of resolution.
Innovation Solution
A multi-spot laser scanning microscope method where the spot spacing is divided into equal parts to allow for flexible adjustment of the scanning field size by varying the number of lines scanned, enabling continuous zooming by adjusting the spot spacing and using a combination of spot data to maintain pixel resolution, and optionally reducing irradiation in overlap regions to avoid sample stress.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the maximum scanning angle of the scanner mirrors is changed to adjust the scanned sample region size, then the imaging scale can be adjusted gradually (zoom function), but the number of available zoom stages is limited and cannot achieve fine graduation with predetermined pixel resolution
Solution Approach 1:
The patent divides the scanning field into multiple part-regions, each scanned by a different number of lines. By segmenting the total scan lines into different combinations for different part-regions, the system achieves fine graduation of zoom stages while maintaining predetermined pixel resolution. For example, with 4 part-regions, the number of scan lines can be divided as 4:4:4:4, 3:4:4:4, 2:4:4:4, 1:4:4:4, or 0:4:4:4, providing 6 different zoom stages.
Solution Approach 2:
The patent dynamically adjusts the number of scan lines allocated to each part-region based on the desired zoom level. The scan control unit varies the number of scan lines for different part-regions in a controlled manner, enabling continuous zoom adjustment. This dynamic allocation of scan lines allows the system to achieve fine graduation of zoom stages while maintaining image quality and pixel resolution.
2Area of stationary object
If the number of scan lines is reduced to enlarge the scanned field, then the field size increases, but the image quality and resolution may be compromised
Solution Approach 1:
The patent segments the scanned field into multiple part-regions and allocates scan lines differently to each part-region. This segmentation allows the total number of scan lines to be distributed optimally across different areas, maintaining image quality even when the overall field size is enlarged. Each part-region can have appropriate scan line allocation to preserve resolution while expanding the total scanned area.
Solution Approach 2:
The patent combines data from multiple part-regions to form the complete scanned field image. By merging the scanned data from different part-regions with different numbers of scan lines, the system reconstructs a high-quality image of the enlarged field. This combining approach allows the system to achieve both large field size and maintained image quality through intelligent data integration.
3Adaptability or versatility
If the spot spacing is fixed to maintain uniform scanning, then the zoom function is restricted to specific field sizes, but changing spot spacing may cause crosstalk or loss of resolution
Solution Approach 1:
The patent segments the scanning field into multiple part-regions and applies different scan line allocations to each segment. This segmentation allows the system to adjust the effective spot spacing in different part-regions independently, achieving flexible field size adjustment without causing crosstalk. The uniformity of scanning is maintained within each part-region while the overall field size varies through combinatorial allocation.
Solution Approach 2:
The patent applies different numbers of scan lines to different part-regions based on local requirements. Each part-region can have optimized scan line allocation tailored to its specific needs, allowing local adjustment of spot spacing and scan density. This local quality approach enables flexible field size adjustment while maintaining scan uniformity and preventing crosstalk in each specific region.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for continuous and flexible zooming of scanning fields with predetermined pixel resolution, enabling both enlargement and reduction of field sizes with fine graduation, maintaining image quality and reducing unnecessary irradiation, thus overcoming the limitations of conventional zooming techniques.
Implementation Method 1
The deflection of the beam usually takes place by means of movable scanning mirrors
Implementation Method 2
passes, collimated via a collimator KO
Implementation Method 3
The illumination spots generated in an intermediate image ZB1 by the LA
Implementation Method 4
The illumination spots generated in an intermediate image ZB1 by the LA are collimated via the multi-spot lens L and refracted towards the optical axis
Implementation Method 5
The foci generated in the intermediate image ZB2 after the scanning objective SCO are imaged further by means of the microscope objective O (not shown) onto the sample
Implementation Method 6
The individual beams collimated after the passage through LA are focused by the pinhole objective in the plane of a pinhole
Data Source
AI summary
Disclosed is a method for varying the size of the scanning field of a multifocal laser scanning microscope, said scanning field being scanned in X columns and Y lines, and n laser spots being arranged at a distance d from one another in the scanning field along the slow scanning axis in the sample plane, the distance between the scanned lines in the sample plane being a=d/K, where KεN, the size of the scanning field being varied by varying K. After scanning K lines, a vertical skip is made, e.g. a skip of (n−1)×K+1 lines in the scanning direction or (n+1)×K−1 lines against the scanning direction until at least Y lines have been scanned.