Microscopic Imaging With a Single Detector Across Visible and SWIR
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Solution Overview
Problem
Current microscopy technologies face challenges in imaging microscopic objects across a wide spectral range from visible to short-wave infrared, requiring multiple detectors and optical components, leading to cumbersome setup changes, increased costs, and reduced data acquisition rates.
Innovation Solution
A device with an array of light-sensitive areas sensitive to a wide wavelength range (400-1200 nm) detects interference patterns between scattered and non-scattered light, eliminating the need for switching detectors or objectives, allowing for compact, cost-effective, and aberration-free imaging across the visible to SWIR range.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple detectors and optical components are used to cover visible to SWIR range, then spectral imaging capability is improved, but device complexity increases
Solution Approach 1:
The patent employs a single imaging detector that can detect both visible and SWIR wavelengths, making it a universal detector that performs multiple functions. This eliminates the need for separate visible and SWIR detectors, thereby reducing device complexity while maintaining broad spectral imaging capability
Solution Approach 2:
The patent merges the functionality of multiple detectors (visible and SWIR) into a single detector array. By combining these detection functions into one device, the system reduces the total number of components while preserving the ability to image across the entire visible to SWIR spectral range
2Adaptability or versatility
If detectors and objectives are switched between visible and SWIR applications, then spectral range coverage is improved, but ease of operation deteriorates
Solution Approach 1:
The imaging detector is designed to be universal, capable of detecting both visible and SWIR wavelengths without requiring physical replacement. This eliminates the need for switching between different detectors and objectives, significantly improving ease of operation while maintaining broad spectral coverage
3Adaptability or versatility
If component switching is required between wavelength ranges, then spectral imaging flexibility is improved, but productivity decreases
Solution Approach 1:
The single detector array continuously captures images across the entire visible to SWIR spectrum without interruption for component switching. This continuous operation maintains high data acquisition rates and productivity, as the system can immediately acquire spectral data without pausing to replace detectors or objectives
4Adaptability or versatility
If multiple microscope instruments are used for different spectral ranges, then imaging versatility is improved, but device complexity increases
Solution Approach 1:
The patent merges the functionality of multiple specialized microscope instruments (one for visible, one for SWIR) into a single unified system. This consolidation reduces the total number of instruments from two to one, decreasing device complexity while preserving imaging versatility across both spectral ranges through the use of a single detector capable of detecting both wavelength ranges
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables versatile, high-resolution imaging of microscopic objects without the need for component switching, reducing costs and improving data acquisition rates by using a single setup for the entire spectral range.
Implementation Method 1
an array of light sensitive areas, each of the light sensitive areas being sensitive to detect light spanning a wavelength range of at least 400-1200 nm
Implementation Method 2
the array of light sensitive areas is configured to detect an interference pattern formed by interference between the scattered light and the non-scattered light
Data Source
AI summary
According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising:an array of light sensitive areas sensitive to detect light spanning a wavelength range of at least 400-1200 nm;at least one light source comprising at least a first point of operation in which the at least one light source is configured to generate visible light, and a second point of operation in which the at least one light source is configured to generate infrared light, and being arranged to illuminate the microscopic object such that light is scattered by the microscopic object;wherein the array of light sensitive areas is configured to detect an interference pattern formed between the scattered light and non-scattered light;the device being configured to be set in a selected point of operation from the at least first and second points of operation, for detecting the interference pattern for imaging the microscopic object at a wavelength defined by the selected point of operation.