Microscopy Cost Function for Non-Uniform Optical Sectioning
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Solution Overview
Problem
Existing optical sectioning microscopy techniques, such as confocal microscopy, structured illumination microscopy (SIM), Dynamic Speckle Imaging (DSI), HiLo, and random illumination microscopy (RIM), face challenges with data processing complexity, hardware requirements, and the need for uniform illumination patterns, which can be affected by imperfections like dust, scratches, and optical aberrations, leading to reduced performance and increased computational burden.
Innovation Solution
A microscope and microscopy method that uses a control unit to minimize or maximize a scalar cost function based on statistical dispersion of structured illumination patterns, allowing for optical sectioning without the need for uniform illumination, and compensates for variations in excitation patterns, using incoherent light sources and sample shifting to improve image quality and reduce data complexity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional optical sectioning techniques (confocal, SIM, DSI, HiLo, RIM) are used, then optical sectioning capability is achieved, but data processing complexity and computational burden increase
Solution Approach 1:
The patent extracts and removes the requirement for uniform illumination patterns from the optical sectioning process. By using non-uniform illumination patterns and adjusting the cost function to account for illumination variations, the method eliminates the need for complex uniform illumination generation and processing, thereby reducing data processing complexity while maintaining optical sectioning capability
Solution Approach 2:
The patent changes the illumination pattern parameter from uniform to non-uniform. This parameter change allows the system to work with simpler illumination conditions, reducing the computational burden associated with correcting illumination non-uniformity while achieving optical sectioning through the modified cost function optimization
2Measurement precision
If uniform illumination patterns are required for optical sectioning, then image quality is improved, but hardware requirements and system complexity increase
Solution Approach 1:
The patent removes the hardware requirement for uniform illumination generation. By formulating the cost function to handle non-uniform illumination patterns, the system eliminates the need for complex uniform illumination hardware while maintaining the ability to produce high-quality optical sectioned images through software-based correction
Solution Approach 2:
The patent replaces expensive and complex uniform illumination hardware with simpler non-uniform illumination sources. The method uses readily available light sources combined with computational correction, eliminating the need for specialized uniform illumination equipment and reducing overall system cost and complexity
3Measurement precision
If coherent light sources are used for structured illumination, then optical sectioning is achieved, but hardware cost increases
Solution Approach 1:
The patent replaces expensive coherent light sources (lasers) with cheaper incoherent light sources. The method uses incoherent illumination patterns combined with cost function optimization to achieve optical sectioning, eliminating the need for costly laser equipment while maintaining imaging quality and sectioning capability
4Measurement precision
If many illumination patterns are acquired to stabilize variance, then optical sectioning is achieved, but measurement time increases
Solution Approach 1:
The patent changes the illumination pattern parameter from requiring many patterns to stabilize variance to using fewer non-uniform patterns. The modified cost function allows for effective optical sectioning with a reduced number of illumination patterns, significantly decreasing measurement time while maintaining image quality
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method enhances optical sectioning capabilities by correcting for non-uniform illumination, reducing hardware requirements, and simplifying data processing, enabling high-speed and precise imaging without the need for coherent light sources, thus improving image quality and throughput.
Implementation Method 1
a detection beam path comprising a microscope objective for guiding the emission light to the detector
Data Source
AI summary
A microscope comprising a detector for detecting emission light emitted by a sample, a detection beam path comprising a microscope objective for guiding the emission light to the detector and a control unit configured for collecting and evaluating measurement data Ck from the detector. The control unit is configured for carrying out the following steps: a measurement data collection step wherein measurement data Ck are collected from the detector while the sample is sequentially illuminated with at least two different sample illumination patterns Jk and a sample information calculation step wherein a microscopic sample information S is calculated which minimizes or maximizes a scalar cost function L=D[ρ(Jk·S),ρ(Ck)], wherein ρ is a measure of statistical dispersion with respect to the sample illumination pattern index k, and D is a distance metric.