Microscopy Deflection Device for Parallel Image Acquisition
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Solution Overview
Problem
Current microscopy techniques, such as structured illumination microscopy and confocal laser scanning microscopy, face limitations in achieving high-resolution images quickly and efficiently due to the need for multiple image recordings, complex algorithms, and high equipment costs, while methods like image-scanning microscopy are slow and require extensive processing.
Innovation Solution
A method that aligns the image positions of scanning partial images on an optical sensor with the illumination spots on the object, using a correction factor greater than 1 to focus all scanning partial images onto a single spot, allowing for simultaneous integration and reducing the need for post-processing, and utilizing a deflection device with a dichroic beam splitter to separate and redirect emission light, enabling faster image acquisition with reduced equipment complexity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If structured illumination microscopy is used to improve spatial resolution, then resolution is improved by a factor of approximately 2, but multiple separate wide-field images must be recorded and complicated numerical algorithms are required, making the process time-consuming and expensive
Solution Approach 1:
The patent divides the object into multiple illumination spots arranged in a predetermined pattern, with each spot illuminated separately to create scanning partial images. This segmentation allows parallel processing of different regions, improving acquisition speed while maintaining resolution enhancement through the corrective mapping of partial images to their corresponding illumination spot positions
Solution Approach 2:
The patent applies a corrective mapping in advance that accounts for the magnification difference between the illumination path and detection path. This preliminary correction ensures that scanning partial images are properly positioned and scaled before final image reconstruction, eliminating the need for complex post-processing algorithms and reducing computation time
2Measurement precision
If confocal laser scanning microscopy is used to improve axial resolution, then spatial resolution in the axial direction is achieved, but the lateral resolution is still restricted by the diffraction limit and equipment complexity increases
Solution Approach 1:
The patent combines the advantages of wide-field microscopy (simple optics, fast detection) with the resolution enhancement capabilities of structured illumination. By using multiple illumination spots simultaneously detectable by a wide-field sensor, it achieves improved resolution without requiring complex confocal optics or sequential scanning, thereby reducing device complexity while maintaining axial and lateral resolution improvements
3Measurement precision
If image-scanning microscopy is used to achieve high resolution, then excellent image quality is obtained, but the method is slow and requires extensive post-processing
Solution Approach 1:
The patent replaces the slow mechanical scanning approach of image-scanning microscopy with a parallel illumination system using multiple spots detected simultaneously by a wide-field sensor. This substitution of mechanical sequential scanning with parallel optical detection dramatically increases acquisition speed while the corrective mapping algorithm maintains image quality by properly positioning and scaling each partial image contribution
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the rapid formation of high-resolution microscope images with reduced equipment outlay and processing time, maintaining excellent image quality while lowering production and operational costs.
Implementation Method 1
emission of excitation light with an excitation wavelength by a light source... detection of a scanning partial image... which emission light is emitted at the respective illumination spot by the object as a reaction to the illumination with excitation light
Implementation Method 2
utilizing a deflection device with a dichroic beam splitter to separate and redirect emission light
Data Source
AI summary
A method for creating a microscope image of an object includes emitting excitation light, illuminating points on the object in a rastering manner, and detecting a raster partial image of a predetermined magnification for each illuminated point. An optical sensor detects emission light from the object excited by the excitation light. Distances between pairs of raster partial images correspond to distances of the illumination points multiplied by a correction factor. A microscopy device includes a light source, a rastering device, an optical sensor, and a deflecting device for deflecting the emission light. The deflecting device feeds excitation light passing through an inlet to the rastering device, light deflected at the rastering device to a first outlet, and emission light passing through the first outlet to the rastering device such that the emission light is deflected from the optical axis in the same direction as the excitation light.