Optical and Particle Beam Microscopy Image Registration
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Solution Overview
Problem
Current methods for correlating optical microscopy and particle beam microscopy images are laborious, especially for 3D data sets, and often require manual registration or sample preparation with visible registration marks, which can disrupt further examinations and are not practical for achieving accurate spatial correlation.
Innovation Solution
A method that involves preparing a partial quantity of samples with registration marks visible in both microscopy types, imaging them to create registered pairs, removing the marks, training a registration algorithm on these pairs, and then using this algorithm to register the remaining samples without marks, maximizing a quality measure for precise position correlation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual registration of images is performed, then position correlation between optical and particle beam microscopy images can be achieved, but the process becomes very laborious and impracticable for 3D data sets
Solution Approach 1:
The system performs automatic self-registration by detecting registration marks in both optical and electron microscopy images, computing transformation parameters algorithmically, and applying corrections without human intervention. This eliminates the laborious manual adjustment process while maintaining accurate position correlation between the two microscopy modalities.
Solution Approach 2:
The manual mechanical adjustment process is replaced by an automated computational system that detects registration marks, calculates spatial transformations, and applies corrections through software-controlled coordinate system transformations. This substitutes human-operated mechanical registration with an automated image processing and computational geometry system.
2Measurement precision
If registration marks are added to samples, then accurate position correlation can be achieved, but the marks can disrupt further examinations of the sample
Solution Approach 1:
The registration marks are detected and extracted from the images during the registration process, and their locations are recorded for later removal. This allows the marks to serve their registration function temporarily while preserving the option to eliminate them from the final processed images, preventing disruption to subsequent sample examinations.
Solution Approach 2:
The registration marks are temporarily introduced into the sample preparation process to enable accurate registration, then discarded from the final images after serving their purpose. The system recovers the spatial correlation information needed for accurate image alignment while eliminating the harmful visual disruption caused by the marks in the final examination images.
3Adaptability or versatility
If combination microscopes integrating both optical and particle beam microscopy are used, then both microscopy methods can be applied to the same sample, but the device complexity and manufacturing outlay increase significantly
Solution Approach 1:
The patent creates a universal registration system that works with separate optical and electron microscopes, allowing the same registration mark detection and image correlation algorithms to be applied regardless of which microscopy modality is used. This multi-functional approach enables dual microscopy capability without requiring a complex integrated combination microscope system.
Solution Approach 2:
The system segments the microscopy workflow into independent optical microscopy and electron microscopy steps, with registration marks serving as a common reference framework that bridges the two separate systems. This segmentation allows each microscope to operate independently with standard equipment while achieving coordinated multi-modal imaging through software-based image correlation.
4Device complexity
If sequential use of separate optical and electron microscopes is employed, then device complexity is reduced, but the position and axial position correlation between images from the two microscopes cannot be exactly correlated
Solution Approach 1:
Registration marks serve as an intermediary reference element that connects the coordinate systems of separate optical and electron microscopes. These marks are visible in both modalities and provide a common reference framework that enables precise spatial correlation between images acquired from different microscopy systems, eliminating position correlation errors.
Solution Approach 2:
The system changes the coordinate system parameters of one or both images by calculating transformation matrices based on the positions of registration marks detected in each modality. This parameter transformation aligns the spatial references between optical and electron microscopy images, achieving exact position correlation despite using separate instruments.
Data Source
AI summary
A method for the microscopy of samples using optical microscopy and particle beam microscopy provides that the samples are divided into a partial quantity and a residual quantity and the samples of the partial quantity are prepared to contain registration marks. The samples of the partial quantity are imaged using optical microscopy and particle beam microscopy, with the result that a pair of optical microscopy images and particle beam microscopy images is obtained for each sample of the partial quantity. The pairs are position-registered relative to each other using the registration marks. The images of the position-registered pairs are modified by removing the registration marks. A registration algorithm is trained which evaluates the image contents and issues a quality measure for a position registration of each pair. The objects of the residual quantity are imaged. These pairs are position-registered by the trained registration algorithm to maximize the quality measure.