Scanning Microscopy Image Reconstruction via Signal Reassignment

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Solution Overview

Problem

High-resolution microscopy methods face challenges in achieving accelerated image reconstruction without introducing artifacts, as existing techniques fail to effectively combine data from detector pixels and correct for spatial variations in the point spread function.

Innovation Solution

The method involves focusing illumination radiation to create a non-diffraction-limited illumination spot, imaging it in a diffraction-limited fashion on a spatially resolving detector, and performing reassignment and unmixing steps to combine pixel data and correct for point spread function variations, allowing for increased scanning distances and reduced overlap between scanning positions, thereby accelerating the microscopy process while avoiding artifacts.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If coarse scanning is used to accelerate image recording, then scanning speed is improved, but image reconstruction quality deteriorates due to missing information and artifacts

Engineering Contradiction:
Improveimage recording speedVSAvoidimage reconstruction quality
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent divides the image reconstruction process into multiple processing steps: data collection from detector pixels, reassignment of signals to appropriate image locations, and unmixing to separate overlapping contributions. This segmentation allows coarse scanning data to be systematically processed into high-quality images without requiring fine scanning at every position.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs preliminary data processing and modeling before final image reconstruction. By pre-characterizing the system response and preparing reconstruction algorithms in advance, the method enables faster acquisition with coarse scanning while maintaining reconstruction quality through pre-planned correction strategies.

Inventive Principle:
Principle #10Preliminary action

2Device complexity

If simple spatial assignment of detector signals is used, then reconstruction process is simplified, but image quality deteriorates due to disturbing artifacts

Engineering Contradiction:
Improvereconstruction process complexityVSAvoidimage quality
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The patent introduces an intermediary unmixing step between simple spatial assignment and final image formation. This intermediary process separates the mixed signals from multiple detector pixels that contribute to each image location, removing artifacts while maintaining a manageable reconstruction process through modular processing steps.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Manufacturing precision

If overlapping scanning positions are used, then image reconstruction accuracy is improved, but scanning time increases

Engineering Contradiction:
Improveimage reconstruction accuracyVSAvoidscanning time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent changes the scanning parameters by allowing larger distances between adjacent scanning lines while using computational reassignment and unmixing to maintain accuracy. This parameter change in scanning step size, combined with signal processing, reduces total scanning time while preserving reconstruction quality through mathematical correction of the sparser sampling.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables faster scanning and improved image resolution beyond the optical imaging limit, reducing the occurrence of artifacts and enhancing the speed and accuracy of high-resolution microscopy.

Implementation Method 1

focusing of illumination radiation into an illumination spot in or on the sample

Methodology Applied
Scientific EffectFocusing: Focusing

Implementation Method 2

stimulating the emission of detection radiation at a sample spot that coincides with the illumination spot

Methodology Applied
Scientific EffectFluorescence: Fluorescence

Implementation Method 3

The sample spot is imaged into an image that is static on a spatially resolving surface detector... the imaging has a resolution limit

Methodology Applied
Scientific EffectDiffraction-limited imaging: Diffraction

Data Source

PatentUS10746657B2Method for accelerated high-resolution scanning microscopy
Publication Date: 2020.08.18 CARL ZEISS MICROSCOPY GMBH
  • US10746657B2 patent drawing
  • US10746657B2 patent drawing
  • US10746657B2 patent drawing

AI summary

In a method for high-resolution scanning microscopy of a sample, provision is made of focusing of illumination radiation into an illumination spot in or on the sample and stimulating the emission of detection radiation at a sample spot that coincides with the illumination spot. The sample spot is imaged into an image that is static on a spatially resolving surface detector having pixels of a size that spatially resolve the image, wherein the imaging has a an optical imaging resolution limit. The entire sample is captured by performing a scanning movement of the illumination spot and of the coinciding sample spot over the sample in a scanning operation. An image of the sample having a resolution that is increased beyond the optical imaging resolution limit of the imaging is produced from the data of the pixels for each scanning position.