Microscopy Sample Carrier Distance Measurement
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Solution Overview
Problem
In microscopy, the varying heights and tilts of sample carriers due to manufacturing tolerances can lead to collisions between the sample carrier and optical elements, causing damage, and existing methods require optical elements for focusing and safety precautions for high-energy radiation.
Innovation Solution
A distance measuring device using divergently emitting illumination sources and a detection optical unit to capture reflections and determine the distance and tilt of the sample carrier without the need for focusing optics, allowing for safe and precise positioning of the sample carrier relative to the optical elements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If focused beams or collimated beams in sharply delimited light spots are directed onto the sample carrier, then the geometry and surface structure of the sample carrier can be deduced from reflection positions, but optical elements for focusing are required and high-energy radiation requires additional safety precautions
Solution Approach 1:
The invention extracts the focusing function from the measurement system by using divergently emitted measurement radiation instead of focused beams. The divergent illumination naturally provides angular information that eliminates the need for separate focusing optics while maintaining the ability to determine sample carrier geometry and surface structure from reflection patterns
Solution Approach 2:
The invention changes the emission parameter of the illumination source from parallel/collimated light to divergent light. This parameter change transforms the measurement approach from requiring focused beams to using naturally divergent illumination, thereby eliminating the need for focusing optical elements while preserving measurement capability
2Measurement precision
If high-energy radiation is used for measurement, then measurement capability is improved, but additional safety precautions are required to prevent injury to users or third parties
Solution Approach 1:
The invention replaces high-energy radiation sources with inexpensive, low-risk light sources such as LEDs. These conventional light sources provide sufficient measurement capability without the safety hazards of high-energy radiation, effectively substituting a dangerous measurement approach with a safe and economical alternative
Solution Approach 2:
The invention converts the potential harm of high-energy radiation into benefit by using the natural divergence of conventional light sources. The divergent emission pattern, which might seem like a limitation, actually provides the angular information needed for measurement, eliminating safety risks while maintaining measurement precision
3Manufacturing precision
If the objective is brought close to the sample to be imaged, then image quality is improved, but the risk of collision between objective and sample carrier increases
Solution Approach 1:
The invention performs preliminary measurement of the sample carrier's position, distance, and tilt using divergent illumination before the objective approaches the sample. This advance information allows the system to plan safe movement trajectories and maintain appropriate clearance, preventing collisions while still enabling high-quality imaging when needed
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise determination of the sample carrier's distance and tilt, preventing collisions and eliminating the need for high-energy safety precautions, while using inexpensive light sources and reducing technical complexity.
Implementation Method 1
at least one, preferably at least two, illumination sources (7) for providing measurement radiation (MS) which is reflected at least proportionally at a surface of the sample carrier (5)
Data Source
AI summary
A distance measuring device in microscopy contains a sample stage for arranging a sample carrier in a sample plane, and at least one, preferably at least two illumination sources for providing measurement radiation, which is reflected at least proportionally at a surface of the sample carrier. The device also contains a detection optical unit for capturing an overview image and occurring reflections at the sample carrier present in the sample plane; a detector disposed downstream of the detection optical unit and serving for the spatially resolved capture of image data of the sample carrier and of occurring reflections; and an evaluation device for ascertaining at least a distance of the surface at at least one location of the sample carrier. The illumination sources emit the measurement radiation in each case at a divergent emission angle. A corresponding method can be used for ascertaining a spatial orientation of a sample carrier.