Microservice Fault Injection Using Dynamic State-Based Test Settings
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Solution Overview
Problem
Existing fault test technologies for microservice architectures struggle to generate flexible and appropriate faults that match the dynamic state of microservices, leading to inefficiencies and increased fault points.
Innovation Solution
A test support device and method that includes a storage unit for microservice information, state information, and fault conditions, along with a processor to select and set faults based on these factors, enabling tailored fault generation for microservices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual fault design and generation is performed, then fault test reliability is improved, but test development time and labor cost increase
Solution Approach 1:
The system enables self-service by allowing the fault injection device to automatically select and generate faults based on microservice state information without requiring manual intervention. The processor autonomously determines fault types and settings by analyzing current microservice states, eliminating the need for manual fault design while maintaining test reliability.
Solution Approach 2:
The system dynamically changes fault parameters based on real-time microservice state information. The processor adjusts fault type, fault setting item, and setting value according to the current state of microservices (such as CPU load, memory usage, or operational status), enabling adaptive fault generation that matches actual system conditions without manual reconfiguration.
2Extent of automation
If predetermined fault scenes are injected into fixed indicators, then test automation is improved, but adaptability to dynamic microservice states deteriorates
Solution Approach 1:
The system transitions from static fault injection to dynamic fault injection by continuously monitoring microservice state information and adjusting fault parameters in real-time. The processor selects fault types and settings based on current microservice states, enabling the system to adapt to changing conditions while maintaining automation. This dynamic approach ensures faults are injected appropriately based on actual system state rather than fixed predetermined scenarios.
3Reliability
If fault tests are performed on all microservices, then test coverage is improved, but test complexity and resource consumption increase
Solution Approach 1:
The system applies local quality by tailoring fault injection strategies to individual microservices based on their specific state information. Rather than applying uniform fault tests to all microservices, the processor analyzes the unique state of each microservice (such as current load, operational status, or configuration) and selects appropriate fault types and settings for each, optimizing test coverage while reducing unnecessary complexity from overly broad testing.
Data Source
AI summary
Provided is a test support device capable of designing a fault that matches a microservice state that can change at all times. A processor of a test support device includes: a test execution unit that selects a microservice and a reliability function, which are configured in the test target system and tested for a fault, on the basis of microservice information, and selects a type of fault to be generated in the microservice in a test on the basis of a fault condition; and a fault setting information creation unit that selects a microservice to generate a fault on the basis of microservice state information, determines a setting value of a fault setting item for the microservice and the fault type, and creates fault setting information.