Microspectrometer Calibration via Resonance Wavelength Shifting
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional micromechanical Fabry-Perot interferometers are sensitive to manufacturing tolerances and environmental conditions, requiring external components for intensity and wavelength adjustments, which complicates calibration and increases system dependency.
Innovation Solution
A method for calibrating a microspectrometer module using different resonance wavelength orders and bandpass filter edges, allowing for simultaneous intensity and wavelength shift calibration without additional external components, utilizing a Fabry-Perot interferometer, bandpass filter, and detector, with optional distance, light, and temperature sensors for precise calibration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional micromechanical Fabry-Perot interferometers are used with external components for intensity and wavelength adjustments, then calibration can be performed, but device complexity increases and system dependency increases
Solution Approach 1:
The patent combines multiple calibration functions (intensity adjustment and wavelength shift correction) into a single integrated calibration process using the Fabry-Perot interferometer's own resonance wavelengths, eliminating the need for separate external adjustment components and reducing system complexity while maintaining calibration accuracy
Solution Approach 2:
The interferometer uses its own resonance wavelengths as reference signals for calibration, making the system self-calibrating without requiring external calibration components or additional hardware, thereby reducing device complexity while maintaining measurement precision
2Reliability
If additional components like Spektralon or Teflon are used for intensity adjustment, then environmental influences can be corrected, but device complexity increases
Solution Approach 1:
The patent merges intensity adjustment and wavelength calibration into a unified process using the interferometer's resonance characteristics, eliminating the need for separate Spektralon or Teflon components while maintaining the ability to correct environmental influences on the optics or electronics
Solution Approach 2:
The system uses its own resonance wavelength intensity variations to perform self-calibration for environmental effects, removing dependency on additional corrective components and reducing overall device complexity while preserving reliability
3Manufacturing precision
If wavelength shift correction is performed independently of intensity adjustment, then manufacturing tolerances can be compensated, but calibration time increases
Solution Approach 1:
The patent combines wavelength shift correction and intensity adjustment into a single simultaneous calibration process that uses the interferometer's resonance wavelengths for both purposes, reducing calibration time while maintaining the ability to compensate for manufacturing tolerances
Solution Approach 2:
The system performs preliminary identification of resonance wavelengths and their intensities in a single measurement sequence, allowing both wavelength and intensity calibration to be completed together rather than in separate sequential steps, thereby reducing overall calibration time
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable and efficient calibration of microspectrometer modules under controlled conditions, reducing manufacturing-related errors and environmental influences, and eliminating the need for additional hardware, resulting in robust and cost-effective spectrometer systems.
Implementation Method 1
Conventional micromechanical Fabry-Perot interferometers typically consist of two mirror elements arranged on a substrate over a through-hole
Implementation Method 2
narrow-band areas around a resonance wavelength and their overtones being transmitted depending on the distance between the two mirrors
Implementation Method 3
An additional bandpass filter located in front of it can, for example, filter out the desired order so that errors caused by other orders are suppressed
Data Source
Figure 1~3
Figure 4
Figure 5~6
AI summary
The invention relates to a method for calibrating a microspectrometer module (100). The microspectrometer module (100) comprises an optical resonator (104) with an adjustable mirror spacing, a bandpass filter (112) upstream of the optical resonator (104), and a detector (114) for detecting the intensity of light transmitted by the optical resonator (104). In the method, the optical resonator (104) is first driven to shift a transmission range of the optical resonator (104) beyond at least one limit of a transmission range of the bandpass filter (112) by changing the mirror spacing. In response to the driving action, the detector (114) is read out to record a transmission spectrum. Finally, the transmission spectrum is evaluated using a reference spectrum to calibrate the microspectrometer module (100).