Microstructural Image Analysis Using Persistence Diagrams
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Solution Overview
Problem
Existing microstructural image analysis technologies fail to quantify relationships between multiple regions within a microstructural image, such as the correlation between individual phases in an electron microscope image of an alloy.
Innovation Solution
A microstructural image analysis device and method that includes a region processing unit to extract and expand regions, an overlapping region extraction unit to identify overlapping regions, and a persistence diagram generation unit to generate persistence diagrams based on hole regions created and eliminated due to overlapping regions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing microstructural image analysis technologies are used, then individual region analysis can be performed, but quantitative analysis of relationships between multiple regions cannot be achieved
Solution Approach 1:
The patent applies segmentation by dividing the microstructural image into multiple binary images, each representing a specific phase or region. This allows individual region characteristics to be analyzed separately while maintaining the ability to study their relationships through operations like expansion and overlapping region extraction.
Solution Approach 2:
The patent transforms the analysis from two-dimensional spatial relationships to three-dimensional feature space by extracting multiple features (area, perimeter, circularity, etc.) and using persistence diagrams. This dimensional transformation enables quantitative comparison of topological features across different regions and scales.
2Loss of information
If traditional analysis methods are used, then processing speed can be maintained, but the ability to extract topological features and generate persistence diagrams is limited
Solution Approach 1:
The patent performs preliminary binarization and region extraction to create binary images representing different phases before conducting the main topological analysis. This preliminary processing organizes the data in a way that facilitates efficient persistence diagram generation and reduces computational complexity in subsequent steps.
Solution Approach 2:
The patent creates binary image copies representing different phases and their expanded versions to analyze topological features without modifying the original image. This copying approach allows multiple analysis iterations and persistence diagram generation from the same source data, preserving information while enabling comprehensive quantitative analysis.
Data Source
AI summary
The invention is to provide a microstructural image analysis device and a microstructural image analysis method capable of quantifying the relations in a plurality of regions included in a microstructural image. There is provided a microstructural image analysis device for analyzing a microstructural image. The microstructural image analysis device includes a region processing unit that extracts a first region and a second region from the microstructural image and expands the first region and the second region, an overlapping region extraction unit that extracts an overlapping region of both the first region and the second region each time the first region and the second region are expanded, and a persistence diagram generation unit that generates a persistence diagram based on a hole region generated and eliminated due to the overlapping region.