Microstructured Energy Filter for Complex Ion Implantation Profiles

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Solution Overview

Problem

Current ion implantation technologies face challenges in producing complex dopant depth profiles with high throughput, ease of filter replacement, and achieving high lateral homogeneity, particularly in semiconductor materials like silicon carbide, due to limitations in filter design, handling, and cooling systems.

Innovation Solution

The implementation of a microstructured energy filter with a filter frame that allows for easy handling and cooling, combined with a multifilter concept and sacrificial layers, enables the production of complex dopant profiles with high throughput and improved lateral homogeneity by modifying the ion beam's energy distribution and using sacrificial layers to adjust the doping profile.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a microstructured energy filter is used to produce complex dopant depth profiles, then manufacturing precision and adaptability are improved, but device complexity and ease of operation deteriorate due to difficult filter handling and replacement

Engineering Contradiction:
Improvedopant depth profile precisionVSAvoidfilter replacement ease
Core Design Contradiction:
Manufacturing precisionVSEase of operation

Solution Approach 1:

The filter system is segmented into modular filter elements that can be independently handled and replaced. Each filter element is designed as a separate component with standardized mounting interfaces, allowing individual replacement without replacing the entire filter assembly. This segmentation maintains the precision of complex dopant profiles while improving operational ease.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The filter holder and mounting mechanism are designed with universal interfaces that accommodate different filter element types and configurations. A single holder design can support various filter geometries and microstructures, reducing the need for specialized tools and procedures for each filter type, thereby improving ease of operation while maintaining manufacturing precision.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Productivity

If high ion beam current is used to increase throughput, then productivity is improved, but temperature increases causing harmful thermal effects

Engineering Contradiction:
Improvewafer processing throughputVSAvoidthermal damage to filter
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The filter system implements periodic cooling cycles and intermittent operation modes that allow the filter to dissipate heat between processing intervals. The cooling system operates in a periodic manner, activating during low-current intervals and reducing capacity during high-current intervals, maintaining thermal balance while preserving high throughput capability.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The cooling system utilizes phase transition materials (such as phase change materials that absorb heat during melting) integrated into the filter structure. These materials undergo phase transitions at controlled temperatures, absorbing excess thermal energy during high-current operation and releasing it during cooling phases, thereby protecting the filter from thermal damage while maintaining high productivity.

Inventive Principle:
Principle #36Phase transitions

3Manufacturing precision

If complex filter structures are used to achieve desired dopant profiles, then manufacturing precision is improved, but ease of manufacture deteriorates

Engineering Contradiction:
Improvedopant concentration controlVSAvoidfilter fabrication difficulty
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The filter manufacturing process utilizes parameter changes in the substrate material (such as varying crystal orientation, doping levels, or thermal properties) to achieve different dopant profiles without changing the fundamental filter geometry. By controlling material parameters rather than complex structural parameters, the manufacturing precision is maintained while ease of manufacture is improved.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The filter elements are constructed using composite material systems that combine multiple materials with complementary properties. These composite structures achieve complex dopant profiles through material composition rather than geometric complexity, simplifying the fabrication process while maintaining precise dopant concentration control through the inherent properties of the composite materials.

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for the creation of complex dopant profiles with high throughput and improved lateral homogeneity, facilitating the production of semiconductor components with non-uniform doping curves, while simplifying filter replacement and cooling systems, thus addressing the limitations of existing technologies.

Implementation Method 1

By means of ion implantation, it is possible to achieve the doping or production of defect profiles, in any desired material such as semiconductor material

Methodology Applied
Scientific EffectIon implantation: Ion Implantation

Implementation Method 2

The energy of a monoenergetic ion beam is modified upon passage through a microstructured energy filter component as a function of the point of entry

Methodology Applied
Scientific EffectEnergy loss in matter:

Data Source

PatentUS12080510B2Energy filter element for ion implantation systems for the use in the production of wafers
Publication Date: 2024.09.03 MI2 FACTORY GMBH
  • US12080510B2 patent drawing
  • US12080510B2 patent drawing
  • US12080510B2 patent drawing

AI summary

A method of monitoring compliance with filter specification during the implantation of ions into a substrate reading a signature of the filter and comparing the read signature with filter signatures stored in a database to identify properties of the filter including at least one of a maximum allowable temperature of the filter and a maximum allowable accumulated ion dose of the filter. The temperature and/or the accumulated ion dose of the filter is measured while ions are implanted into the substrate by an ion beam passing through the filter. The implantation is terminated when the measured temperature or accumulated ion dose of the filter reaches or exceeds the maximum allowable threshold.