Microwave Crystallization of Amorphous Silicon Solar Cells

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Solution Overview

Problem

Amorphous silicon thin film solar cells have low energy-converting efficiency and suffer from the Staebler-Wronski effect, where efficiency decreases over time, and microcrystalline silicon layers formed under higher process pressures or with higher frequency plasma sources face contamination and thickness uniformity issues, leading to reduced productivity.

Innovation Solution

A method of fabricating solar cells using a microwave to crystallize intrinsic semiconductor layers from amorphous silicon to microcrystalline silicon, improving crystallinity and deposition rate while minimizing process time and contamination, employing a microwave generating unit that moves over the substrate to apply microwaves within specific frequency ranges and controlled conditions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If amorphous silicon is used for thin film solar cells, then material cost is reduced and flexibility is improved, but energy-converting efficiency is lowered

Engineering Contradiction:
Improvematerial costVSAvoidenergy-converting efficiency
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent changes the crystalline structure parameter of the silicon material from amorphous to microcrystalline, thereby improving energy-converting efficiency while maintaining the thin film structure advantages of low cost and flexibility

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent uses a composite structure combining microcrystalline silicon intrinsic layer with amorphous silicon buffer and contact layers, optimizing both efficiency and manufacturing advantages

Inventive Principle:
Principle #40Composite materials

2Duration of action of stationary object

If amorphous silicon thin film solar cells are exposed to light for longer time, then operational duration increases, but efficiency is reduced due to Staebler-Wronski effect

Engineering Contradiction:
Improveoperational durationVSAvoidefficiency
Core Design Contradiction:
Duration of action of stationary objectVSReliability

Solution Approach 1:

The patent changes the material structure from amorphous to microcrystalline silicon, which fundamentally eliminates the Staebler-Wronski effect and maintains stable efficiency over extended operational periods

Inventive Principle:
Principle #35Parameter changes

3Productivity

If microcrystalline silicon is deposited under higher process pressure to increase deposition rate, then productivity is improved, but contamination increases and layer density is reduced

Engineering Contradiction:
Improvedeposition rateVSAvoidlayer density
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent optimizes the deposition pressure parameter to an intermediate range that balances deposition rate with layer quality, avoiding both low-pressure slow deposition and high-pressure contamination

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements process monitoring and control mechanisms to maintain optimal deposition conditions, adjusting parameters in real-time to prevent contamination while maintaining high deposition rates

Inventive Principle:
Principle #23Feedback

4Productivity

If higher frequency plasma source is used to deposit microcrystalline silicon, then deposition rate is improved, but thickness uniformity is degraded due to standing wave

Engineering Contradiction:
Improvedeposition rateVSAvoidthickness uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent introduces motion dynamics by moving the substrate or plasma source during deposition, disrupting standing wave patterns and achieving uniform thickness distribution while maintaining high deposition rates

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent employs periodic modulation of deposition parameters or oscillatory motion to prevent standing wave formation, ensuring uniform layer thickness throughout the substrate

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the productivity of solar cell fabrication by forming high-crystallinity microcrystalline silicon layers with improved efficiency and reduced process time, addressing the limitations of amorphous silicon and microcrystalline silicon deposition methods, and is applicable to tandem or triple structure solar cells.

Implementation Method 1

irradiating a microwave to form a second intrinsic semiconductor layer of microcrystalline silicon by crystallizing the first intrinsic semiconductor layer

Methodology Applied
Scientific EffectMicrowave radiation: Microwave Radiation

Implementation Method 2

crystallizing the first intrinsic semiconductor layer

Methodology Applied
Scientific EffectCrystallization: Crystallisation

Implementation Method 3

irradiating a first microwave to form a second intrinsic semiconductor layer of microcrystalline silicon by crystallizing the first intrinsic semiconductor layer

Methodology Applied
Scientific EffectDielectric heating: Dielectric Heating

Data Source

PatentUS8173484B2Method of fabricating solar cell using microwave and apparatus for the same
Publication Date: 2012.05.08 JUSUNG ENG
  • US8173484B2 patent drawing
  • US8173484B2 patent drawing
  • US8173484B2 patent drawing

AI summary

A method of fabricating a solar cell includes: forming a first electrode on a substrate; forming a first impurity-doped semiconductor layer on the first electrode; forming a first intrinsic semiconductor layer of amorphous silicon on the first impurity-doped semiconductor layer; forming a second impurity-doped semiconductor layer over the first impurity-doped semiconductor layer, forming a second electrode over the second impurity-doped semiconductor layer; and irradiating a first microwave to form a second intrinsic semiconductor layer of microcrystalline silicon by crystallizing the first intrinsic semiconductor layer.