Microwave Heating Sputtering Device for Copper Reflow

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Solution Overview

Problem

The copper reflow process in chip manufacturing faces inefficiencies due to slow heating rates and long cycle times in existing sputtering technologies, which affect the filling of deep trenches and increase the risk of hollow holes and electrical performance issues in copper interconnections.

Innovation Solution

A sputtering device incorporating a microwave heating mechanism that uses a movable microwave transmitter to emit microwaves directly to the workpiece, enhancing heating efficiency by allowing the metal film to reflect and return microwaves, thereby accelerating temperature rise and shortening the reflow process cycle.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If a heating lamp is used to heat the wafer in a thermal radiation manner, then the wafer can reach the required temperature for copper reflow, but the heating efficiency is low and the temperature rise rate is slow

Engineering Contradiction:
Improvewafer temperatureVSAvoidreflow process cycle time
Core Design Contradiction:
TemperatureVSLoss of time

Solution Approach 1:

The patent replaces the thermal radiation heating system (heating lamp) with a microwave heating system. The microwave transmitter emits microwave energy that directly interacts with the wafer and deposited metal film, converting electromagnetic energy to thermal energy much more efficiently, thereby dramatically reducing the heating time and reflow process cycle time while achieving the required temperature for copper reflow.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent employs periodic cycling of the deposition and reflow processes multiple times. Each cycle consists of depositing a metal film followed by microwave-assisted reflow heating. Through repeated cycling, the deep trenches are progressively filled without forming hollow holes, ultimately achieving complete filling while maintaining controlled heating time in each cycle.

Inventive Principle:
Principle #19Periodic action

2Quantity of substance

If the copper seed layer is deposited by PVD method, then the copper can be deposited on the wafer, but the growth rate is faster at the trench opening causing protrusion and preventing complete filling

Engineering Contradiction:
Improvecopper depositionVSAvoidtrench filling uniformity
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The patent performs preliminary deposition of a metal seed layer (such as copper, aluminum, or tungsten) on the deep trench structure before the main copper filling process. This preliminary layer serves as a foundation that modifies the subsequent deposition behavior, helping to control the growth rate and prevent excessive protrusion at the trench opening during later filling operations.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent utilizes microwave heating to change the thermal parameters of the deposited metal film during the reflow process. By controlling the temperature profile through microwave energy, the metal atoms gain enhanced surface mobility and can diffuse more uniformly into the deep trenches, transforming the deposition dynamics to achieve better filling uniformity and reduce protrusion formation.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The microwave heating mechanism significantly reduces the reflow process cycle time, improving production efficiency and ensuring complete filling of deep trenches, thus enhancing the electrical performance of copper interconnections.

Implementation Method 1

The microwave transmitter is connected to a mobile device and configured to move the microwave transmitter to a position under the workpiece in response to the workpiece being carried by the pin mechanism to cause the microwave transmitter to emit microwaves to the workpiece to heat the workpiece

Methodology Applied
Scientific EffectMicrowave heating: Dielectric Heating

Implementation Method 2

enhancing heating efficiency by allowing the metal film to reflect and return microwaves

Methodology Applied
Scientific EffectMicrowave reflection: Reflection

Data Source

PatentUS12195842B2Sputtering device with microwave heating mechanism
Publication Date: 2025.01.14 BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
  • US12195842B2 patent drawing
  • US12195842B2 patent drawing
  • US12195842B2 patent drawing

AI summary

A sputtering device includes a reaction chamber, a pin mechanism, and a microwave heating mechanism. The reaction chamber includes a base configured to carry a workpiece. The pin mechanism is arranged in the reaction chamber. The pin mechanism generates a relative ascending and descending motion with the base and lifts the workpiece from the base. The microwave heating mechanism is arranged in the reaction chamber and includes a microwave transmitter and a mobile device. The mobile device is connected to the microwave transmitter and configured to move the microwave transmitter to a position under the workpiece in response to the workpiece being carried by the pin mechanism to cause the microwave transmitter to emit microwaves to the workpiece to heat the workpiece.