Scanning Microwave Vibration And Deformation Measurement Without Targets
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Solution Overview
Problem
Existing microwave vibration and deformation measurement technologies require aiming targets like corner reflectors, which add mass and affect dynamic characteristics, and struggle with high angular resolution and clutter interference, especially in multi-point and full-field measurements.
Innovation Solution
A scanning method and system using linear-frequency-modulation continuous waves with phase shift control to direct a synthesized beam, receive echoes, and perform non-linear demodulation to measure vibration and deformation without aiming targets, achieving high signal-to-noise ratio and angular resolution through beam synthesis focusing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If aiming targets such as corner reflectors are mounted on the inspected object, then signal strength and multi-points inspection recognition ability are improved, but additional mass is added affecting intrinsic dynamic characteristics and measurement convenience deteriorates
Solution Approach 1:
The patent extracts and removes the aiming targets (corner reflectors) from the measurement system. Instead of requiring external targets to be mounted on the inspected object, the invention uses the object's own scattered electromagnetic waves as the measurement signal source, thereby eliminating the need for additional mounting components and preserving the object's intrinsic dynamic characteristics.
Solution Approach 2:
The inspected object serves itself as the scattering target for microwave measurement. The object's natural scattering properties are utilized to generate the measurement signal, eliminating the need for external aiming targets and their associated mounting procedures, thus improving measurement convenience while maintaining signal quality.
2Measurement precision
If a large number of transceiver channels are used to achieve high angular resolution, then measurement precision is improved, but device complexity and suppression of coupling clutter interference become more difficult
Solution Approach 1:
The patent transitions from a two-dimensional transceiver array approach to a three-dimensional scanning measurement approach. By introducing the time dimension through sequential scanning of multiple angles and positions, the system achieves high angular resolution without requiring a large number of simultaneous transceiver channels, thereby reducing device complexity and computational burden for clutter suppression.
3Measurement precision
If aiming targets are mounted for multi-point measurement, then measurement precision is improved, but additional mass and mounting requirements affect the inspected object and worsen measurement convenience
Solution Approach 1:
The patent removes the requirement for mounting aiming targets at multiple measurement points. By using the inspected object's own scattered waves and implementing a scanning measurement approach, the system achieves multi-points inspection capability without physical targets, eliminating all associated mounting and fixing operations.
Solution Approach 2:
The scanning microwave measurement system serves multiple measurement points universally without requiring point-specific targets. A single movable transmitter and receiver system can measure multiple locations by changing positions and angles, providing universal multi-points measurement capability that eliminates the need for location-specific target mounting.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise, high-resolution measurement of microwave vibration and deformation without aiming targets, reducing clutter interference and improving measurement convenience, especially in multi-point and full-field scenarios.
Implementation Method 1
performing phase shift control on transmit signals of the plurality of transmit antennas, and enabling a main lobe of a synthesized beam to be directed towards a measured specific angle direction
Implementation Method 2
achieving high signal-to-noise ratio and angular resolution through beam synthesis focusing
Implementation Method 3
receiving echoes by using a plurality of receive antennas to obtain multi-channel baseband signals
Implementation Method 4
the premise of performing microwave vibration measurement technology is the reflection or strong scattering of electromagnetic waves by the inspected target
Implementation Method 5
performing non-linear demodulation processing on the acquired multi-channel baseband signals to obtain vibration and deformation displacement values
Implementation Method 6
A new type of vibration and deformation measurement technology based on microwave sensing has been applied to measure small and large vibration and deformation
Data Source
AI summary
A scanning method and system for measuring microwave vibration and deformation include simultaneously transmitting linear-frequency-modulation continuous waves by using a plurality of transmit antennas and enabling a main lobe of a synthesized beam to be directed towards a specific angle direction; receiving echoes by using a plurality of receive antennas to obtain vibration and deformation displacement values of a single target or multiple targets in an angle direction 1 of a cycle; through the phase shift control on the plurality of transmit antennas, extracting vibration and deformation displacement values of a single target or multiple targets in an angle direction 2 of the cycle based on the foregoing method; according to a measurement requirement, measuring and extracting vibration and deformation displacement values of a single target or multiple targets in another angle direction of the cycle; and obtaining vibration and deformation displacement time sequence values of all scanned points.