Microwave Module TRL Calibration Using Standard Modules

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Solution Overview

Problem

Current methods for calibrating microwave boxes are prone to errors due to difficulties in modeling the environment, especially for BGA-type packages, and the TRL calibration introduces calibration errors by modifying the test platform configuration and differing connections between microstrip lines and microwave ports.

Innovation Solution

A method involving standard microwave boxes with specific connections (Thru, Reflect, and Line configurations) to determine the test platform's characteristics, ensuring identical electrical interfaces and precise measurement of electrical lengths to accurately calibrate the test platform and determine the electrical length of etched lines.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If TRL calibration is used to calibrate the test platform, then calibration can be performed, but calibration errors are introduced due to configuration modifications and connection differences

Engineering Contradiction:
Improvecalibration accuracyVSAvoidmeasurement precision
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent creates a copy of the actual test environment by fabricating standard boxes that replicate the BGA package structure, ball array configuration, and electrical interfaces. This copying approach allows calibration to be performed on an exact replica of the test setup, eliminating the configuration modifications and connection differences that cause errors in traditional TRL calibration methods

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent introduces standard boxes as intermediary calibration artifacts that mediate between the calibration process and the actual microwave boxes under test. These standard boxes serve as a bridge that maintains consistent electrical interfaces and connection methods, thereby eliminating the calibration errors introduced by direct TRL configuration changes

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of manufacture

If simulation modeling is used to determine microwave box characteristics, then characteristics can be obtained, but precision deteriorates due to difficulties in modeling the environment and interface

Engineering Contradiction:
Improveease of characterizationVSAvoidcharacterization precision
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent enables the test platform to self-characterize by using standard boxes with known, precisely controlled electrical properties. The platform measures the standard boxes and automatically extracts its own environmental characteristics and interface parameters, eliminating the need for complex manual simulation modeling while achieving high precision through actual measurements rather than theoretical models

Inventive Principle:
Principle #25Self-service

Data Source

PatentEP2286251B1Trl calibration method for a microwave module and a set of standard modules
Publication Date: 2018.08.08 THALES SA
  • EP2286251B1 patent drawingFigure 1
  • EP2286251B1 patent drawingFigure 2~4
  • EP2286251B1 patent drawingFigure 5

AI summary

The invention relates to a method of calibrating a test platform (5) for microwave modules (1). According to the invention, the Thru, Reflect and One standard units are replaced by microwave standard modules fulfilling similar functions, the test platform (5) being adapted accordingly. The use of standard modules makes it possible to maintain the same electrical interface (2, 6) between each of the modules (1) and the test platform (5). The invention also relates to a method of determining an electrical length Lc of an etched line connecting two microwave ports (2a, 2b) of a microwave standard module. The standard module may be connected to the test platform (5). According to the invention, various electrical lengths of the test platform (5) are measured so as to be able to deduce therefrom the electrical length Lc of the etched line of the standard module. The invention has the advantage of obtaining the electrical length Lc by measurement rather than by modelling.