Visible and Millimeter-Wave Image Overlay With Distance Alignment
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Solution Overview
Problem
Existing imaging systems fail to effectively integrate visible-light and millimeter-wave images to grasp the positional relationship between them, limiting the ability to observe the same region at different wavelengths.
Innovation Solution
An imaging system comprising a visible-light image capturing device, a millimeter-wave image capturing device, a distance measurement device, and a processor that superimposes visible-light and millimeter-wave images based on stored information about the millimeter-wave image edges and end points, with optional laser light emission for focus control and edge indication.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of information
If visible-light and millimeter-wave images are captured separately without integration, then each image can be obtained independently, but the positional relationship between the two images cannot be grasped
Solution Approach 1:
The patent introduces a visible-light image as an intermediary to establish the positional relationship between the millimeter-wave image and the structure. The visible-light image capturing device captures the structure surface, and this information serves as a reference framework to determine where the millimeter-wave image corresponds to in physical space, thereby solving the positional relationship problem without requiring complex direct coordination between the two imaging systems
Solution Approach 2:
The patent creates a digital copy of the visible-light image and superimposes the millimeter-wave image onto it. By generating a composite image where the millimeter-wave image data is overlaid on the visible-light image framework, the system preserves the positional relationship information while allowing independent capture of both images, effectively copying the spatial structure from the visible-light domain to the millimeter-wave domain
2Measurement precision
If the millimeter-wave image is superimposed on the visible-light image without distance compensation, then the superimposition process is simple, but the superimposition accuracy deteriorates with varying imaging distances
Solution Approach 1:
The patent performs preliminary distance measurement using a distance measurement device (such as a laser distance meter) before the superimposition process. The imaging distance from the visible-light image capturing device to the structure is measured in advance, and this distance information is stored and used as a compensation parameter during superimposition, ensuring accurate alignment even when imaging distances vary
Solution Approach 2:
The patent changes the parameter of imaging distance through active measurement and compensation. By measuring the actual distance and applying compensation transformations based on this distance parameter, the system adapts the superimposition process to varying imaging conditions, maintaining accuracy across different distances without requiring a fixed imaging setup
3Adaptability or versatility
If only visible-light imaging is used, then the system is simple, but the ability to observe inside the structure and detect damages is limited
Solution Approach 1:
The patent creates a universal imaging system that can observe the same structure using two different wavelengths (visible light and millimeter waves). The visible-light image capturing device observes the surface, while the millimeter-wave image capturing device penetrates to observe the inside of the structure. Both imaging modes are integrated into a single system that can adaptively select or combine observation methods based on the inspection requirements
Solution Approach 2:
The patent merges the visible-light imaging system and the millimeter-wave imaging system into an integrated dual-imaging system. By combining the surface observation capability of visible light with the penetration capability of millimeter waves, the system achieves comprehensive inspection capability that can observe both the exterior and interior of structures, with the added benefit of spatial correlation through image superimposition
Data Source
AI summary
An imaging system includes a visible-light image capturing device that images an object with light including visible light to acquire a visible-light image, a millimeter-wave image capturing device that images the object with an electromagnetic wave in a millimeter-wave band to acquire a millimeter-wave image, a distance measurement device that measures an imaging distance to the object, a memory in which information indicating end points and/or edges of the millimeter-wave image in the visible-light image is stored in correspondence with the imaging distance; and a processor. The processor acquires information in correspondence with the imaging distance by referring to the memory and generates a superimposed image in which the visible-light image and the millimeter-wave image are superimposed based on the acquired information.