MIM Capacitor Material Resistors for IC Fabrication

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional resistors in integrated circuits, particularly those made from doped polycrystalline silicon, suffer from high resistance variability due to non-uniform hydrogen penetration and doping processes, while metal resistors require additional processing steps increasing fabrication costs and complexity.

Innovation Solution

The integration of metal-insulator-metal (MIM) capacitor material is used to form resistor structures within integrated circuits, eliminating the need for additional masking processes and enabling precise resistance definition by patterning the capacitor material to create resistor segments.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If doped polycrystalline silicon is used to form resistors, then the fabrication process is simpler, but the resistance variability is high

Engineering Contradiction:
Improvefabrication process simplicityVSAvoidresistance precision
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent changes the material parameter from doped polycrystalline silicon to metal-insulator-metal capacitor material, which inherently provides more precise resistance definition without requiring additional process complexity. This material substitution resolves the contradiction by achieving both ease of manufacture and manufacturing precision simultaneously.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If metal resistors are used to achieve precise resistance, then the resistance precision is improved, but the device complexity increases

Engineering Contradiction:
Improveresistance precisionVSAvoidprocessing steps
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies multi-functionality by using the same metal-insulator-metal capacitor material for both capacitor and resistor functions. The capacitor material is deposited once, then selectively patterned to form either capacitors or resistors based on the desired circuit function, eliminating the need for separate metal resistor processing steps and reducing overall device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent merges the fabrication processes for capacitors and resistors into a single unified process flow. Both structures are formed from the same deposited capacitor material using the same patterning and etching steps, combining what were previously separate processes into one integrated fabrication sequence.

Inventive Principle:
Principle #5Merging (Combining)

3Manufacturing precision

If metal resistors are used to achieve precise resistance, then the resistance precision is improved, but the fabrication cost increases

Engineering Contradiction:
Improveresistance precisionVSAvoidfabrication cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent achieves cost reduction through multi-functionality, where the metal-insulator-metal capacitor material serves dual purposes as both capacitor and resistor material. This eliminates the need for additional metal deposition and patterning steps that would increase fabrication costs, while still achieving precise resistance values.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS10115719B2Integrated circuits with resistor structures formed from MIM capacitor material and methods for fabricating same
Publication Date: 2018.10.30 GLOBALFOUNDRIES US INC
  • US10115719B2 patent drawing
  • US10115719B2 patent drawing
  • US10115719B2 patent drawing

AI summary

Integrated circuits having resistor structures formed from a MIM capacitor material and methods for fabricating such integrated circuits are provided. In an embodiment, a method for fabricating an integrated circuit includes providing a semiconductor substrate with a resistor area and a capacitor area. The method includes depositing a capacitor material over the resistor area and the capacitor area of the semiconductor substrate. The method also includes forming a resistor structure from the capacitor material in the resistor area. Further, the method includes forming electrical connections to the resistor structure in the resistor area.