Massive MIMO OTA Test Chamber with Neural Network Calibration
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Solution Overview
Problem
Current over-the-air (OTA) test methods for massive MIMO wireless communication systems are inadequate in simultaneously measuring various OTA measurement metrics, leading to high costs and slow test speeds, particularly in manufacturing settings where fast and cost-effective solutions are needed.
Innovation Solution
A method and system utilizing a compact OTA test chamber with probe antennas to measure calibration and RF channel parameters, applying a mapping relationship to determine beam gain and beam width of MIMO antenna elements, allowing for efficient testing and calibration without mechanical scanning, and using a neural network for training with known-good and known-bad devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple different OTA test systems are used to measure various OTA measurement metrics, then measurement completeness is improved, but testing cost increases
Solution Approach 1:
The patent implements a universal OTA test chamber that can perform multiple types of measurements (far-field, near-field, beamforming, MIMO channel measurements) using a single integrated system with reconfigurable probe arrays, eliminating the need for multiple separate test systems and reducing overall testing cost while maintaining measurement completeness
2Measurement precision
If traditional OTA test approaches are used, then measurement accuracy is maintained, but test speed is inadequate
Solution Approach 1:
The patent divides the antenna array under test into multiple sub-arrays and uses multiple probe antennas to simultaneously measure different segments, enabling parallel measurement of multiple RF channels and significantly increasing test speed while maintaining measurement accuracy through coordinated processing of segmented data
Solution Approach 2:
The patent performs pre-calibration of the probe antennas and establishes channel state information before actual measurements, allowing for faster subsequent measurements without compromising accuracy, as the preliminary setup enables streamlined data collection and processing
3Quantity of substance
If a large number of DUTs are tested in manufacturing settings, then production coverage is improved, but test time increases
Solution Approach 1:
The patent enables continuous testing operations by implementing fast measurement protocols that minimize idle time between DUTs, using pre-configured test sequences and rapid data processing to maintain continuous productive action throughout the manufacturing test workflow
Solution Approach 2:
The patent prepares test configurations, calibration data, and measurement parameters in advance before each DUT is tested, allowing for rapid sequential testing of multiple devices without repetitive setup time, thereby increasing production coverage while controlling overall test time
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables fast, cost-effective testing and calibration of MIMO systems by using a compact OTA test chamber and neural network training, improving test speed and reducing costs while accurately assessing beam performance.
Implementation Method 1
measuring a first intensity of a near field radiation pattern produced by the MIMO antenna elements within the OTA test chamber
Data Source
AI summary
A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.