Miniature Spectrum Measuring Device Using Thin Film Filter

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Solution Overview

Problem

Conventional spectrum measuring devices are costly, complex, and require high installation accuracy, making them unsuitable for portable use outside laboratory environments.

Innovation Solution

A miniature spectrum measuring device utilizing a thin film filter with a multilayer structure that performs spectral modulation processing on transmitted or reflected light from an object, allowing for spectrum reconstruction without the need for spectral separation processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional spectral separation processing is used, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improvespectrum measurement precisionVSAvoiddevice structure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces conventional mechanical spectral separation components (gratings, prisms) with a thin film filter based optical interference system. The thin film filter uses optical interference principles to achieve spectral separation, eliminating the need for complex mechanical moving parts while maintaining measurement precision.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the operating parameters by using multiple light sources with different central wavelengths instead of a single light source with spectral separation. This parameter change allows the system to achieve spectrum measurement without mechanical spectral separation, reducing device complexity.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If grating spectroscopic devices are used, then measurement precision is improved, but installation accuracy requirements increase

Engineering Contradiction:
Improvespectrum measurement precisionVSAvoidinstallation accuracy requirement
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent replaces mechanical grating spectroscopic devices with a thin film filter based optical interference system. The thin film filter is a static optical component that does not require precise mechanical alignment or adjustment, thereby reducing installation accuracy requirements while maintaining measurement precision.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If multiple filters and detectors are used, then measurement precision is improved, but cost and manufacturing difficulty increase

Engineering Contradiction:
Improvespectrum measurement precisionVSAvoidmanufacturing difficulty
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent makes the thin film filter serve multiple functions: it acts as both the optical interference element for spectral separation and the spectral response modulation element. This multi-functionality reduces the total number of components needed, simplifying manufacturing while maintaining measurement precision.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent merges the functions of spectral separation and spectral response modulation into a single thin film filter structure. By combining these functions, the system reduces the number of separate filters and detectors needed, thereby reducing manufacturing difficulty and cost.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The device enables low-cost, compact spectrum measurement with improved detection speed and accuracy, suitable for use outside laboratory settings.

Implementation Method 1

a thin film filter with a multilayer structure that performs spectral modulation processing on transmitted or reflected light from an object

Methodology Applied
Scientific EffectOptical interference: Interference

Data Source

PatentUS12281940B2Miniature spectrum measuring device and thin film filter
Publication Date: 2025.04.22 LITE ON SINGAPORE PTE LTD
  • US12281940B2 patent drawing
  • US12281940B2 patent drawing
  • US12281940B2 patent drawing

AI summary

A filter and a miniature spectrum measuring device are provided. The filter includes a plurality of film structures. Each of the film structures includes an H-type structural film, an L-type structural film, and a cavity film disposed between the H-type structural film and the L-type structural film.