Miniature Spectrum Measuring Device Using Thin Film Filter
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Solution Overview
Problem
Conventional spectrum measuring devices are costly, complex, and require high installation accuracy, making them unsuitable for portable use outside laboratory environments.
Innovation Solution
A miniature spectrum measuring device utilizing a thin film filter with a multilayer structure that performs spectral modulation processing on transmitted or reflected light from an object, allowing for spectrum reconstruction without the need for spectral separation processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional spectral separation processing is used, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent replaces conventional mechanical spectral separation components (gratings, prisms) with a thin film filter based optical interference system. The thin film filter uses optical interference principles to achieve spectral separation, eliminating the need for complex mechanical moving parts while maintaining measurement precision.
Solution Approach 2:
The patent changes the operating parameters by using multiple light sources with different central wavelengths instead of a single light source with spectral separation. This parameter change allows the system to achieve spectrum measurement without mechanical spectral separation, reducing device complexity.
2Measurement precision
If grating spectroscopic devices are used, then measurement precision is improved, but installation accuracy requirements increase
Solution Approach 1:
The patent replaces mechanical grating spectroscopic devices with a thin film filter based optical interference system. The thin film filter is a static optical component that does not require precise mechanical alignment or adjustment, thereby reducing installation accuracy requirements while maintaining measurement precision.
3Measurement precision
If multiple filters and detectors are used, then measurement precision is improved, but cost and manufacturing difficulty increase
Solution Approach 1:
The patent makes the thin film filter serve multiple functions: it acts as both the optical interference element for spectral separation and the spectral response modulation element. This multi-functionality reduces the total number of components needed, simplifying manufacturing while maintaining measurement precision.
Solution Approach 2:
The patent merges the functions of spectral separation and spectral response modulation into a single thin film filter structure. By combining these functions, the system reduces the number of separate filters and detectors needed, thereby reducing manufacturing difficulty and cost.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device enables low-cost, compact spectrum measurement with improved detection speed and accuracy, suitable for use outside laboratory settings.
Implementation Method 1
a thin film filter with a multilayer structure that performs spectral modulation processing on transmitted or reflected light from an object
Data Source
AI summary
A filter and a miniature spectrum measuring device are provided. The filter includes a plurality of film structures. Each of the film structures includes an H-type structural film, an L-type structural film, and a cavity film disposed between the H-type structural film and the L-type structural film.


