Miniaturized Raman Spectroscopy with Reference-Based PSF Correction
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Solution Overview
Problem
Existing Raman spectroscopy instruments are bulky and costly, limiting their application in areas requiring miniaturization such as space exploration, on-site toxic substance inspection, and in-vivo diagnostics, due to high instrumentation requirements for stable wavelength and low noise.
Innovation Solution
A miniaturized Raman spectrometer system that uses a single laser beam split into two portions, one interacting with a sample and the other with a reference sample, employing a diffraction element and a detector array to simultaneously collect spectra, and a data acquisition device that determines a point spread function (PSF) to correct for laser mode hops and fluctuations, enabling precise spectral calibration and deconvolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high-end Raman instruments are used to achieve high spectral resolution and sensitivity, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent segments the laser beam into multiple portions that are directed to different samples (reference sample and test sample). This allows simultaneous measurement of multiple spectra using a single instrument, effectively distributing the measurement workload and reducing the need for complex instrumentation while maintaining high spectral resolution through the diffraction element and detector array
Solution Approach 2:
The patent uses a reference sample with known spectral characteristics to create a copy of the measurement process. By measuring the reference sample simultaneously with the test sample and using its known spectrum to calculate the point spread function, the system compensates for instrumental broadening without requiring complex deconvolution algorithms or additional instrumentation
2Measurement precision
If high-end Raman instruments are used to achieve high spectral resolution and sensitivity, then measurement precision is improved, but device size increases
Solution Approach 1:
The patent merges the measurement of multiple samples into a single simultaneous operation using one laser source, one diffraction element, and one detector array. The reference sample and test sample are measured concurrently, allowing the system to achieve high spectral resolution without requiring multiple separate instruments or complex multi-component systems that would increase device size
3Measurement precision
If a reference sample is measured simultaneously to determine PSF, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The patent implements continuous simultaneous measurement of both the reference sample and test sample throughout the measurement process. The laser beam portions are directed to both samples at the same time, and the detector array continuously records both spectra, eliminating the need for sequential measurements and ensuring that the point spread function is updated in real-time without interrupting the test sample measurement
Solution Approach 2:
The patent performs preliminary measurement of the reference sample spectrum to establish the known spectral characteristics and calculate the point spread function before processing the test sample data. This preliminary action is performed simultaneously with the test sample measurement, allowing the system to prepare calibration data in advance without delaying the actual measurement process
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system achieves high spectral resolution and sensitivity comparable to large-scale instruments, reducing size and cost while maintaining accuracy in spectral calibration and intensity normalization, suitable for applications like in-vivo diagnostics and space exploration.
Implementation Method 1
the diffraction element being configured to split the first spectrum beam into a first spectrum of spatially separated wavelength components associated with the sample
Implementation Method 2
obtain a first spectrum beam from an interaction between a first portion of a laser beam and a sample
Data Source
AI summary
An apparatus obtains a first spectrum beam from an interaction between a first portion of a laser beam and a sample and a second spectrum beam from an interaction between a second portion of the laser beam and a reference sample. A diffraction element splits the first spectrum beam into a first spectrum associated with the sample and splits the second spectrum beam into a second spectrum associated with the reference sample. A detector with pixels for detecting the first and second spectrum. A data acquisition device carries out a measurement, wherein first data indicative of the first spectrum is detected and second data indicative of the second spectrum is detected, wherein the first data is collected in different pixels than the second data. The data acquisition device:a) determines a point spread function PSF using a convolution function; andb) determines a real spectrum of the sample using the PSF.