Mirrored Pinhole Array for Simultaneous Multi-Plane Confocal Sampling
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Solution Overview
Problem
Current confocal microscopy techniques require lengthy scanning processes to capture multiple sample depths, leading to issues such as motion artifacts, photobleaching, and phototoxicity due to prolonged exposure to high-energy radiation, and lack the ability to simultaneously sample multiple planes effectively.
Innovation Solution
The use of a mirrored pinhole array cavity in combination with a detector and lens system allows for simultaneous measurement of multiple sample depths by focusing light through pinholes to a detector, reducing the need for mechanical scanning and minimizing exposure to high-energy radiation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If confocal microscopy uses scanning to capture multiple sample depths, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The patent divides the single detection function into multiple spatially separated pinholes arranged in an array, where each pinhole corresponds to a different sample depth plane. This segmentation allows simultaneous detection of multiple depths without sequential scanning, resolving the contradiction between measurement precision and time loss.
Solution Approach 2:
The patent transitions from single-point detection to array-based parallel detection by adding the spatial dimension of multiple pinholes. This dimensional expansion enables simultaneous sampling of multiple depth planes, eliminating the time-consuming sequential scanning process while maintaining optical sectioning precision.
2Measurement precision
If confocal microscopy scans sample patterns repeatedly to obtain measurements at various depths, then measurement precision is improved, but object-affected harmful factors increase
Solution Approach 1:
By segmenting the detection function across multiple pinholes, the system captures all depth information simultaneously in a single excitation event, eliminating repeated scanning. This reduces the cumulative light exposure to the sample, thereby decreasing photobleaching and phototoxicity while maintaining depth measurement precision.
Solution Approach 2:
The patent enables continuous simultaneous detection of multiple depth planes without interruption or repetition. This continuous parallel detection achieves the same measurement precision as repeated scanning but with a single excitation event, minimizing harmful light exposure to the sample.
3Adaptability or versatility
If confocal microscopy uses adjustable mirrors for scanning, then adaptability is improved, but device complexity increases
Solution Approach 1:
The patent replaces the mechanical mirror scanning system with a static pinhole array configuration. The adaptability previously achieved through mechanical scanning is replaced by the geometric arrangement of pinholes that naturally direct light from different depths to corresponding detector elements, eliminating complex moving parts while maintaining versatility.
Solution Approach 2:
The pinhole array structure serves multiple functions simultaneously: it performs optical sectioning, depth discrimination, and parallel detection without requiring additional mechanical components. This multi-functionality achieves the same adaptability as the mirror system but with simpler, more integrated device architecture.
4Measurement precision
If confocal microscopy scans longer to obtain measurements at various depths, then measurement precision is improved, but productivity decreases
Solution Approach 1:
By segmenting the detection function across multiple pinholes, the system performs parallel sampling of multiple depth planes simultaneously. This segmentation enables the same sampling precision to be achieved in a single excitation event rather than through prolonged sequential scanning, dramatically improving imaging rate and productivity.
Solution Approach 2:
The patent adds the spatial dimension of multiple parallel detection channels, transforming the imaging process from sequential single-point sampling to simultaneous multi-point sampling. This dimensional expansion maintains sampling precision while increasing productivity by eliminating the time required for sequential scanning.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances sampling throughput and imaging rates, enabling faster microscopy and real-time volumetric property measurements, suitable for consumer-level devices and applications like tissue diagnostics and super-resolution imaging.
Implementation Method 1
The mirrored pinhole array may be configured to focus at least some light from one or more sample planes within the mirrored pinhole array cavity
Implementation Method 2
The at least one lens may be arranged with the mirrored pinhole array to collect at least some of the focused light from the one or more sample planes via at least one pinhole
Data Source
AI summary
Technologies are disclosed for simultaneous measurement of one or more properties of a sample at one or more sample depths that may be performed by an imaging device. The imaging device may comprise a mirror. The device may comprise a mirrored pinhole array that may comprise one or more pinholes. A mirrored pinhole array cavity may be formed by an arrangement of the mirror and the mirrored pinhole array. The mirrored pinhole array may be configured to focus light from one or more sample planes within the mirrored pinhole array cavity. The device may comprise at least one lens that may be arranged with the mirrored pinhole array to collect the focused light from the one or more sample planes via at least one pinhole of the one or more pinholes. The device may comprise a detector arranged with the at least one lens to receive the collected light.