Automatic Mis-Compare Diagnosis in ATPG Simulation
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Solution Overview
Problem
Current methods for diagnosing mis-compares in ATPG-generated test patterns are tedious and require multiple simulations, waveform debugging, and circuit-tracing from various tools, leading to inefficient identification of defects in functioning circuits.
Innovation Solution
A system and method that automatically diagnose mis-compares by using a first simulator to generate test patterns, a second simulator for validation, and a processor to identify the origin of mis-compares through comparison and diagnosis of output values, utilizing timing-aware models and behavioral simulations to determine the 'pins of interest' and trace back the origin of mis-compares.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual methods are used to determine mis-compare origins through multiple simulations, waveform debugging, and circuit-tracing, then diagnostic accuracy can be achieved, but the process becomes extremely tedious and time-consuming
Solution Approach 1:
The patent segments the complex mis-compare diagnosis process into distinct phases: (1) generating test patterns with ATPG simulator, (2) validating with behavioral simulator, (3) identifying mis-compares, and (4) automatically tracing origins through cone-of-influence analysis. This segmentation transforms a tedious manual process into an automated multi-step procedure that maintains accuracy while reducing time consumption.
Solution Approach 2:
The patent performs preliminary actions by pre-computing and storing cone-of-influence information for each circuit element before validation. When mis-compares are detected, the origin identification uses this pre-prepared structural information to quickly trace back potential sources without requiring extensive runtime analysis or manual waveform debugging.
2Reliability
If multiple simulation tools and manual tracing methods are employed to validate test patterns, then validation accuracy is improved, but device complexity and operational difficulty increase
Solution Approach 1:
The patent merges the ATPG simulator and behavioral simulator into a coordinated validation system where both tools work together through standardized interfaces. The cone-of-influence analysis methodology unifies the approach across different simulation tools, automatically correlating results to identify mis-compare origins without requiring complex manual integration of multiple separate analysis processes.
Solution Approach 2:
The patent introduces an intermediary automated diagnosis system that mediates between the ATPG simulator and behavioral simulator. This intermediary component receives output from both simulators, performs automated comparison, and executes the cone-of-influence tracing algorithm to identify mis-compare origins, thereby simplifying the interaction between complex validation tools.
3Measurement precision
If comprehensive circuit-tracing and waveform debugging are performed to identify mis-compare origins, then diagnostic completeness is improved, but ease of operation deteriorates
Solution Approach 1:
The patent implements self-service by enabling the diagnosis system to automatically perform cone-of-influence analysis and trace mis-compare origins without requiring manual waveform debugging or circuit-tracing operations. The system autonomously correlates mis-compare locations with potential origin points using pre-computed structural information, eliminating the need for operator intervention in complex tracing tasks while maintaining comprehensive diagnostic coverage.
Data Source
AI summary
Systems and methods disclosed herein provide for automatically diagnosing mis-compares detected during simulation of Automatic Test Pattern Generation (“ATPG”) generated test patterns. Embodiments of the systems and methods provide for determining the origin of a mis-compare based on an analysis of the generated test patterns with a structural simulator and a behavioral simulator.