Mixed Signal Test Device Using Integrated Board Architecture
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing mixed signal test solutions require multiple independent boards for resource coordination and control, leading to high equipment costs, complex test program development, and inefficient testing due to frequent interrupt processing.
Innovation Solution
A mixed signal test device using a Tester-On-board architecture integrates power generation and measurement, analog waveform generation and collection, and control units onto a single digital waveform pattern generation and measurement board, enabling parallel execution of digital, analog, and power tests through a shared logic control unit and system bus.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If three independent boards are used for mixed signal testing, then testing capability is achieved, but equipment cost increases and device complexity increases
Solution Approach 1:
The patent combines three independent boards (digital waveform pattern generation board, analog waveform generation board, and power generation board) into a single integrated board. The digital waveform pattern generation unit, analog waveform generation unit, and power generation unit are merged onto one board, reducing the number of separate devices from three to one, thereby simplifying the overall test equipment architecture while maintaining full mixed signal testing capability
Solution Approach 2:
The integrated board is designed with multi-functional capabilities, where a single board can perform digital waveform generation, analog waveform generation, and power generation functions simultaneously. The logic control unit coordinates these different functional units, enabling one device to replace three specialized boards, thus reducing equipment cost and complexity
2Reliability
If three independent boards are used for mixed signal testing, then testing capability is achieved, but equipment cost increases
Solution Approach 1:
By merging three independent boards into one integrated board, the patent reduces the total equipment cost. The consolidation eliminates redundant components and reduces the number of separate devices that need to be manufactured, purchased, and maintained, directly addressing the high equipment cost issue while preserving complete mixed signal testing functionality
3Reliability
If control functions are written for three boards, then testing is performed, but program complexity increases and test efficiency decreases
Solution Approach 1:
The logic control unit is designed as a universal controller that can manage digital waveform generation, analog waveform generation, and power generation functions through a unified control interface. This multi-functional control approach simplifies the test program structure, eliminating the need to write separate control functions for three different boards, thereby reducing program complexity and improving test efficiency
4Reliability
If control functions are written for three boards, then testing is performed, but test efficiency decreases
Solution Approach 1:
By combining three separate board control functions into a single integrated control system, the patent enables more efficient resource coordination and control. The unified logic control unit can manage all testing functions simultaneously without the overhead of coordinating three separate boards, directly improving test efficiency and productivity while maintaining full testing capability
Data Source
AI summary
The present disclosure discloses a mixed signal test device based on graphical control. A Tester-On-board architecture is used to extend a power generation and measurement unit, an analog waveform generation and collection unit and an analog waveform control unit on a digital waveform pattern generation and measurement board. The logic control unit is configured to generate and measure a digital pattern of a System on Chip (SOC) to be tested to achieve generation and collection of the digital waveform, is configured to control the analog waveform control unit to achieve generation and collection control of an analog waveform of the SOC to be tested, and is configured to control the power generation and measurement unit to achieve generation and collection control of power of the SOC to be tested, so that generation and measurement of the digital pattern of the SOC to be tested, generation and collection control of the analog waveform, and generation and collection control of the power are simultaneously concurrently executed. The mixed signal test device based on graphical control is easy and efficient in resource coordination and control.