Mixed-Size Pillars for Probeable IC Interfaces
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The increasing cost of testing integrated circuits due to the miniaturization of micro-pillars, which makes probing and testing more expensive, and the difficulty in using test pads as both testing and operational interfaces due to their size and spacing.
Innovation Solution
The use of larger diameter 'macro'-pillars with similar heights to micro-pillars, allowing for cost-effective probing during testing and serving as an electrical interface during regular operation, while maintaining similar heights to micro-pillars for seamless integration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If micro-pillars are made smaller to increase density, then the number of interfaces increases, but the cost of probing and testing increases
Solution Approach 1:
The interface structure is segmented into two types of pillars: micro-pillars for high-density signal interfaces and macro-pillars for cost-effective testing and power interfaces. This segmentation allows the system to benefit from both high density and low testing cost by assigning different functions to different pillar types.
Solution Approach 2:
Macro-pillars serve multiple functions: they provide cost-effective testing interfaces, power delivery, and ground connections. This multi-functionality reduces the need for separate dedicated test structures, thereby reducing overall manufacturing complexity and cost.
2Device complexity
If test pads are used for both testing and operational interfaces, then device complexity is reduced, but spacing and size constraints limit effectiveness
Solution Approach 1:
The interface is segmented into micro-pillars for signal connections and macro-pillars for power and testing. This segmentation allows each pillar type to be optimized independently: micro-pillars can be densely packed for signal integrity while macro-pillars can be larger and more spaced out for easy probing and power delivery.
Solution Approach 2:
Different regions of the interface are assigned different pillar sizes and functions based on local requirements: signal-critical regions use micro-pillars while power and test regions use macro-pillars. This local differentiation optimizes both density and testability without compromising overall device performance.
Data Source
AI summary
An integrated circuit with probeable and routable interfaces is disclosed. The integrated circuit includes multiple micro-pillars that are attached to the surface of the integrated circuit, and multiple macro-pillars also attached to the surface of the integrated circuit. The micro-pillars provide an electrical interface to the integrated circuit during regular operation. The macro-pillars provide an electrical interface to the integrated circuit both during regular operation and during testing of the integrated circuit.