Multilayer Ceramic Capacitor Ridges with Curved Geometry
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Solution Overview
Problem
Multilayer ceramic capacitors face chipping issues due to a decrease in side margin portion thickness, which reduces the radius of curvature and increases the likelihood of chipping at the ridgeline portion.
Innovation Solution
The design includes a multilayer ceramic capacitor with a specific structure where the variation in distance from the straight line connecting outermost internal electrodes is limited, and the ridgeline portions have distinct curvatures, with a larger radius of curvature for the first ridgeline portion compared to the second, reducing chipping risks even with a thinner side margin.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If the thickness of the side margin portion is decreased, then the capacitance efficiency is improved, but the radius of curvature of the ridgeline portion becomes smaller and chipping is more likely to occur
Solution Approach 1:
The patent applies curvature to the ridgeline portion by forming a rounded surface with a specified radius of curvature (R1) that is larger than the thickness of the side margin portion. This curved geometry redistributes mechanical stresses away from sharp corners, significantly reducing the likelihood of chipping while allowing the side margin to be made thinner for improved capacitance efficiency.
Solution Approach 2:
The patent differentiates the curvature radius at different locations: the ridgeline portion has a larger radius of curvature (R1) compared to other portions (R2). This localized quality optimization ensures that the critical ridgeline area has enhanced chipping resistance through increased curvature, while other areas maintain their original dimensions for optimal electrical performance.
2Volume of moving object
If the side margin portion thickness is reduced, then the overall device size is minimized, but the structural integrity at the ridgeline portion deteriorates
Solution Approach 1:
By forming the ridgeline portion with a rounded surface having a radius of curvature (R1) larger than the side margin thickness, the patent eliminates sharp corners that would act as stress concentration points. This curvature transformation maintains structural integrity even when the side margin is minimized, allowing compact device design without compromising stability.
Solution Approach 2:
The patent proactively designs the ridgeline with enhanced curvature before any mechanical stress is applied. This preemptive geometric modification creates a cushioning effect that absorbs and distributes mechanical loads, preventing structural failure at the ridgeline portion before it can occur during device operation or handling.
3Length of stationary object
If the ridgeline portion has a small radius of curvature, then the side margin thickness is reduced, but chipping resistance deteriorates
Solution Approach 1:
The patent resolves this contradiction by specifying that the ridgeline portion shall have a radius of curvature (R1) that is explicitly larger than the side margin thickness. This inverted approach uses increased curvature at the critical ridgeline location to protect against chipping, while the side margin itself remains thin for miniaturization. The curved geometry creates a stress-distributing profile that prevents chipping despite the reduced overall dimension.
Solution Approach 2:
The patent applies different curvature characteristics to different portions: the ridgeline portion has a larger radius of curvature (R1) for chipping resistance, while other portions have a smaller radius (R2). This localized differentiation allows the side margin to be thin for size reduction while the critical ridgeline area maintains enhanced structural strength through optimized curvature.
Data Source
AI summary
In a multilayer ceramic capacitor, when a cross-section obtained by cutting a multilayer body at a position at a central portion in a length direction and defined in a width direction and a layering direction is viewed, a variation in distance in the width direction from a straight line that connects ends of two internal electrodes located outermost in the layering direction to each other to respective ends of internal electrodes is not larger than about 0.2, a first ridgeline portion connecting the straight line that connects the ends of the two internal electrodes to each other to one main surface of the multilayer body has a first curve, a second ridgeline portion that connects one main surface to one side surface of the multilayer body has a second curve, and the first curve is larger in radius of curvature than the second curve.