MLCC Internal Electrode Oxidation Layout for Crack Prevention

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Solution Overview

Problem

The increase in the number of layers for miniaturization and high capacitance in multilayer ceramic capacitors leads to step differences due to thickness variations, causing thermal stress and potential cracks or delamination, which degrade the reliability of the components.

Innovation Solution

The internal electrodes are designed with oxidized portions at both ends and non-oxidized portions in the center, where t2 < t1, to minimize step differences and enhance bonding forces, preventing cracks and delamination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the number of layers is increased for miniaturization and high capacitance, then capacitance and miniaturization are improved, but step difference increases causing cracks or delamination

Engineering Contradiction:
ImprovereliabilityVSAvoidstep difference
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent applies local quality by creating oxidized portions at specific locations (end portions) of the internal electrodes while keeping other portions non-oxidized. This localized oxidation modifies the properties of specific regions to reduce step differences and prevent cracks or delamination, directly addressing the manufacturing precision issue while maintaining reliability

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent changes the oxidation state parameter of the internal electrode material to create different thickness profiles. By controlling oxidation levels (creating oxidized vs non-oxidized portions), the patent modifies the physical and chemical properties of the electrode to reduce step differences and improve reliability

Inventive Principle:
Principle #35Parameter changes

2Reliability

If the number of layers is increased for miniaturization and high capacitance, then capacitance and miniaturization are improved, but thermal stress increases causing cracks or delamination

Engineering Contradiction:
ImprovereliabilityVSAvoidthermal stress
Core Design Contradiction:
ReliabilityVSStress or pressure

Solution Approach 1:

The oxidized portions are strategically placed at the end portions of internal electrodes where thermal stress and step differences are most severe. This localized modification creates a gradient structure that reduces thermal stress concentration and prevents crack initiation, directly addressing the thermal stress problem

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The oxidized portions act as cushioning regions that are formed in advance to prevent thermal stress-induced cracks. By creating these oxidized zones before the thermal cycling occurs during operation, the patent provides a preventive measure against future thermal stress damage

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design improves the reliability of multilayer electronic components by reducing vertical cracks and delamination, ensuring better mechanical properties and interfacial bonding.

Implementation Method 1

at least one of the internal electrodes includes an oxidized portion arranged at both end portions of the at least one of the internal electrodes in a width direction

Methodology Applied
Scientific EffectOxidation: Oxidation

Data Source

PatentUS20250210262A1Multilayer electronic component
Publication Date: 2025.06.26 SAMSUNG ELECTRO MECHANICS CO LTD
  • US20250210262A1 patent drawing
  • US20250210262A1 patent drawing
  • US20250210262A1 patent drawing

AI summary

A multilayer electronic component includes a body including a dielectric layer and internal electrodes and external electrodes arranged on the body, wherein the internal electrodes include oxidized portions arranged at both end portions in a width direction and oxidized and non-oxidized portions arranged in a center of the internal electrodes in the width direction and not oxidized, wherein t2&lt;t1, in which t1 is an average thickness of the non-oxidized portions and t2 is an average thickness of the oxidized portions.