Multilayer Ceramic Capacitor Grain Structure for Electrostriction Control
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Multilayer ceramic capacitors face issues with electrostrictive destruction and reduced high-temperature reliability due to thin dielectric layers, which also lead to a lower dielectric constant when particle size is minimized for miniaturization and high capacitance.
Innovation Solution
The design incorporates a dielectric layer with varying average particle sizes, where D1 < D3 and D2 < D3, and specific thickness ratios (t1 < t3, t2 < t3) to cancel out electrostriction effects, enhancing reliability and capacitance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If the thickness of the dielectric layer is reduced to achieve miniaturization and high capacitance, then electrical performance such as capacitance is improved, but the frequency of electrostrictive destruction due to electrostriction increases and high-temperature reliability is weakened
Solution Approach 1:
The patent applies local quality by creating different particle size regions within the dielectric layer. Specifically, it forms a first region with a first average particle size and a second region with a second average particle size that is different from the first. This spatial variation in particle size allows different regions to exhibit different electrostriction characteristics, thereby reducing overall electrostrictive destruction while maintaining thin layer thickness for high capacitance.
2Reliability
If the particle size of the dielectric layer is reduced to make it finer to alleviate reduced reliability, then reliability is improved, but a desired capacitance cannot be obtained due to a low dielectric constant
Solution Approach 1:
The patent resolves this contradiction by implementing local quality through spatially varying particle sizes. The first region contains finer particles that improve reliability by reducing electrostrictive destruction, while the second region contains coarser particles that maintain high dielectric constant and capacitance. This local differentiation allows each region to optimize for its specific function.
Solution Approach 2:
The patent employs composite materials by combining dielectric particles of different sizes within the same dielectric layer. This composite structure integrates the benefits of fine particles (improved reliability) and coarse particles (maintained capacitance) into a unified dielectric system, achieving both reliability improvement and capacitance preservation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively reduces electrostrictive destruction, maintains high capacitance, and improves high-temperature reliability by differentiating the particle sizes within the dielectric layers, thereby stabilizing the multilayer ceramic capacitor's performance.
Implementation Method 1
reduce a phenomenon of electrostrictive destruction caused by an electrostriction phenomenon
Data Source
AI summary
A multilayer ceramic capacitor includes a body including a dielectric layer and first and second internal electrodes alternately disposed with the dielectric layer interposed therebetween, a first external electrode disposed on the body and connected to the first internal electrode, and a second external electrode disposed on the body and connected to the second internal electrode. The dielectric layer includes a first dielectric layer adjacent to the first internal electrode, a second dielectric layer adjacent to the second internal electrode, and a third dielectric layer disposed between the first and second dielectric layers. D1<D3 and D2<D3, in which D1 is an average particle size of dielectric grains included in the first dielectric layer, D2 is an average particle size of dielectric grains included in the second dielectric layer, and D3 is an average particle size of dielectric grains included in the third dielectric layer.