Multilayer Ceramic Capacitor Oxidation Control
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Solution Overview
Problem
Multilayer ceramic capacitors face challenges in maintaining excellent dielectric properties due to irregular oxide layer formation at the edges of internal electrodes, leading to capacitance deterioration and reliability issues during miniaturization and multi-functionalization of electronic components.
Innovation Solution
The solution involves controlling the maximum length and standard deviation of oxidation regions at the edges of internal electrodes to 3 μm or less and 1 μm or less, respectively, by forming side margin parts using ceramic slurry and optimizing the sintering process, ensuring uniform distribution and preventing capacitance degradation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If the multilayer ceramic capacitor is miniaturized to increase capacity, then the capacitance per unit area increases, but the oxide layer formation at internal electrode edges becomes irregular, deteriorating dielectric properties
Solution Approach 1:
The patent applies local quality by forming side margin parts with different properties from the main ceramic body. These side margin parts have controlled thickness (1-10 μm) and contain oxide regions with specific characteristics that differ from the bulk material, creating localized zones that prevent irregular oxide layer formation at internal electrode edges while maintaining overall miniaturization benefits
Solution Approach 2:
The side margin parts are formed preliminarily during the green sheet fabrication stage, before sintering and final capacitor assembly. This preliminary formation of protective margin structures ensures that when internal electrodes are subsequently formed and sintered, the oxide layers develop uniformly from the outset, preventing the irregular edge formation that would otherwise occur in miniaturized structures
2Ease of manufacture
If conventional manufacturing methods are used without side margin parts, then the manufacturing process is simple, but the oxide layer length at internal electrode edges is irregular, significantly deteriorating dielectric properties
Solution Approach 1:
The patent changes the physical parameters of the ceramic structure by introducing side margin parts with controlled thickness (1-10 μm) and composition. These parameter changes create a gradient structure that modifies oxide layer development during sintering, ensuring uniform oxide layer length (5-15 μm) at internal electrode edges and thereby improving dielectric properties without significantly complicating the manufacturing process
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach results in a high capacitance multilayer ceramic capacitor with improved dielectric properties and reliability, enhancing the electrical performance and mechanical strength of miniaturized components.
Implementation Method 1
both edges of the internal electrodes include oxide regions, the oxidation regions of an internal electrode contributing to capacitance formation
Implementation Method 2
the green chip is calcined and sintered
Data Source
AI summary
There is provided a multilayer ceramic capacitor including a ceramic body having first and second side surfaces facing each other, and third and fourth end surfaces connecting the first and second side surfaces, a plurality of internal electrodes formed in the ceramic body and having one ends thereof exposed to the third end surface or the fourth end surface, and first and second side margin parts formed from the first and second side surfaces to edges of the internal electrodes, wherein in a width direction of the ceramic body, both edges of the internal electrodes include oxide regions, the oxidation regions of an internal electrode contributing to capacitance formation except for uppermost and lowermost internal electrodes among the internal electrodes have a maximum length Lmax of 3 μm or less, and a standard deviation in length is 1 μm or less.