Millimeter Wave Test Chamber Fading Coefficient Simulation

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current testing methods for millimeter wave devices lack effectiveness in simulating real-world conditions, particularly in directional signal propagation and beamforming, which are critical for 5G communication networks.

Innovation Solution

The method involves determining a reference antenna response of a device-under-test (DUT) to generate fading coefficients for test chamber antennas, allowing for directional signal transmission that mimics the DUT's beamforming patterns, thereby simulating real-world scenarios within a test chamber.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional testing methods are used for millimeter wave devices, then the testing process is simple, but the accuracy of simulating real-world conditions is insufficient

Engineering Contradiction:
Improveaccuracy of simulating real-world conditionsVSAvoidcomplexity of testing process
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by pre-calculating fading coefficients based on reference antenna responses before actual testing. The system stores these pre-computed coefficients and applies them during testing, avoiding complex real-time calculations while maintaining high simulation accuracy for directional signal propagation and beamforming scenarios

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent uses copying by creating virtual representations of real-world channel conditions through fading coefficients that replicate antenna responses. Instead of physically recreating complex propagation environments, the system copies the essential characteristics of real-world signal behavior into the test chamber, achieving accurate simulation without physical complexity

Inventive Principle:
Principle #26Copying

2Reliability

If directional signal propagation and beamforming are simulated, then the testing accuracy improves, but the device complexity increases

Engineering Contradiction:
Improvereliability of device performance in real-world scenariosVSAvoidcomplexity of test chamber configuration
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies parameter changes by manipulating fading coefficients that represent directional signal propagation characteristics. By adjusting these coefficients based on reference antenna responses, the system dynamically changes the electromagnetic field parameters in the test chamber to simulate various beamforming scenarios without adding physical complexity to the test chamber structure

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces mechanical/physical systems with computational methods. Instead of using complex mechanical antenna arrays or physical structures to create directional signal propagation, the system uses software-based fading coefficient calculations and signal processing to achieve the same effect, substituting computational complexity for physical complexity

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentUS10386408B2Methods and apparatus for testing millimeter wave devices
Publication Date: 2019.08.20 QUALCOMM INC
  • US10386408B2 patent drawing
  • US10386408B2 patent drawing
  • US10386408B2 patent drawing

AI summary

Certain aspects of the present disclosure relate to methods and apparatus for testing millimeter wave devices. The method includes determining a reference antenna response of the DUT for at least one antenna of a test chamber, generating one or more fading coefficients for the at least one antenna based on the determined reference antenna response, applying the generated one or more fading coefficients to at least one signal, and transmitting the at least one signal via the at least one antenna to the DUT in the test chamber.