Millimeter Wave Test Fixture Near-Field Antenna Array
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Solution Overview
Problem
Conventional test systems for millimeter wave communications circuitry face challenges in pinpointing test failures, as they require disassembling electronic devices to diagnose issues, which is time-consuming and costly, and struggle to differentiate between millimeter wave circuitry and other components.
Innovation Solution
A test system that includes a test fixture, signal analyzer, and computing equipment to test millimeter wave wireless communications circuitry before assembly, using phased antenna arrays and calibration settings specific to the circuitry design, allowing for accurate performance verification and identification of unsatisfactory components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If millimeter wave communications circuitry is tested in fully-assembled electronic devices using far field testing, then testing can be performed on complete devices, but it becomes difficult to pinpoint whether test failures are attributable to the millimeter wave circuitry or to other components in the electronic device
Solution Approach 1:
The patent segments the testing process by separating the millimeter wave circuitry testing from the fully-assembled device testing. The circuitry is tested independently in a test fixture before assembly, allowing failures to be pinpointed to the circuitry itself rather than other device components. This segmentation enables precise identification of failure sources while maintaining reliable testing.
2Reliability
If conventional far field testing is used on fully-assembled devices, then testing can be performed on complete devices, but the electronic device needs to be disassembled to replace the millimeter wave communications circuitry when a test failure is detected, which is difficult, time consuming, and cost prohibitive
Solution Approach 1:
The patent applies preliminary action by testing the millimeter wave communications circuitry before it is assembled into the electronic device. The circuitry is verified in a test fixture using near field coupling, and only circuitry that passes testing is assembled into the final device. This preliminary testing eliminates the need for disassembly and replacement operations, saving time and reducing costs.
3Measurement precision
If millimeter wave communications circuitry is tested before assembly using near field coupling, then testing accuracy and failure pinpointing improve, but the test system requires precise positioning and calibration
Solution Approach 1:
The patent uses an intermediary approach by introducing a test fixture with a substrate that provides a controlled near field coupling environment. The substrate acts as an intermediary between the test signals and the circuitry under test, enabling precise measurements through controlled electromagnetic coupling. This intermediary structure simplifies the testing process by providing a standardized interface that reduces calibration complexity while maintaining measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise testing and verification of millimeter wave communications circuitry performance before assembly, reducing disassembly needs and costs, and ensuring reliable assembly of satisfactory components into electronic devices.
Implementation Method 1
The array of antennas on the substrate may wirelessly receive millimeter wave test signals (e.g., signals at a millimeter wave frequency of greater than 27 GHz) from the array of antennas on the wireless communications circuitry under test
Data Source
AI summary
An electronic device may be provided with wireless circuitry that handles millimeter wave communications. The wireless circuitry may be tested using a test system that includes a fixture, computing equipment, and a substrate placed in the fixture. The fixture may hold an array of antennas on the substrate at a selected distance from an array of antennas on the wireless circuitry under test. The array on the substrate may receive millimeter wave test signals from the wireless circuitry under test. A transmission line may convey the millimeter wave test signals to a signal analyzer without down-converting the signals. The analyzer and computing equipment may identify performance metric data based on the test signals and may determine whether the wireless circuitry has satisfactory performance based on the performance metric data. The test system may be calibrated using settings that are specific to the design of the wireless circuitry under test.