mmW Device Test Kit with Dual-Sided Signal Plunger
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Solution Overview
Problem
Current testing systems for millimeter wave (mmW) devices face challenges such as longer test times, large physical size, and difficulty in testing both sides of the device due to limitations in conventional plungers, which cannot capture or transmit mmW signals effectively.
Innovation Solution
A test kit with a socket structure and a multi-layered plunger assembly, including a nest and interposer substrate, for stable electrical connection and vacuum gripping of the device under test, utilizing ESD control materials and precision positioning to ensure accurate signal transmission and reception.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional plungers are used for device handling, then mechanical gripping is achieved, but mmW signal transmission is blocked
Solution Approach 1:
The plunger assembly is divided into separate functional components: a non-conductive plunger body for mechanical gripping and separate signal transmission paths. This segmentation allows the plunger to perform both gripping and signal transmission functions simultaneously without interference.
Solution Approach 2:
A non-conductive plunger material acts as an intermediary that mechanically grips the device while allowing mmW signals to pass through unaffected. The non-conductive nature of the plunger material enables signal transmission while maintaining gripping capability.
2Reliability
If stable electrical connection is ensured through rigid socket structures, then connection reliability is improved, but test system size increases
Solution Approach 1:
The socket structure incorporates flexible elements and adjustable components that allow the system to maintain stable electrical connections while adapting to different device sizes and configurations. This dynamic design enables reliable connections without requiring oversized rigid structures.
Solution Approach 2:
The socket structure is designed with universal features that can accommodate multiple device types and configurations. This multi-functionality reduces the need for multiple specialized sockets, thereby reducing overall system size while maintaining connection reliability.
3Productivity
If conventional test setups are used for single-sided testing, then setup simplicity is maintained, but test time increases due to manual repositioning
Solution Approach 1:
The testing system integrates multiple testing capabilities into a single unified platform that can test both sides of the device simultaneously. This merging of functions eliminates the need for manual repositioning and enables parallel testing, significantly improving throughput despite increased system complexity.
Solution Approach 2:
The system transitions from sequential single-sided testing to simultaneous dual-sided testing by utilizing the third dimension (vertical stacking or dual-sided access). This dimensional change allows both sides of the device to be tested at the same time, doubling the effective throughput.
4Manufacturing precision
If precision positioning components are added to the socket structure, then positioning accuracy is improved, but device complexity and cost increase
Solution Approach 1:
The socket structure incorporates self-aligning features and self-positioning mechanisms that automatically achieve precise device positioning without requiring complex external positioning systems. This self-service approach improves positioning accuracy while minimizing additional complexity.
Solution Approach 2:
The system achieves precision positioning by optimizing key parameters such as tolerance specifications, material properties, and geometric configurations of the socket components. By carefully controlling these parameters, high positioning accuracy is achieved without requiring overly complex structures.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution reduces test time and system size, enhances signal transmission efficiency, and allows for reliable testing of mmW devices on both sides, improving test accuracy and reducing costs.
Implementation Method 1
a lower portion of the plunger assembly that vacuum grips the DUT and places the DUT to test site on the socket structure
Implementation Method 2
the nest is made of an electrostatic-discharge (ESD) control material or a static-dissipative material
Data Source
AI summary
This disclosure provides a test kit for testing a device under test (DUT) including a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger assembly includes a multi-layered structure having a nest and an interposer substrate installed under the nest.