Two-Sided mmWave Imaging Beat Pattern Correction for 3D Visibility
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Solution Overview
Problem
Two-sided reflection-based millimeter wave imaging systems suffer from wavelength-dependent beat patterns when coherently combining images from each side, leading to distorted image quality and reduced visibility of occluded regions.
Innovation Solution
A beat pattern correction operator is applied, combining image data from two arrays using a phase correction term, specifically (1+j) for one array and (1-j) for the other, to mitigate the beat pattern and enhance image quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of information
If two-sided reflection imaging is used to overcome occlusion by opaque portions, then visibility of occluded regions is improved, but wavelength dependent beat patterns are introduced causing distorted image quality
Solution Approach 1:
The patent applies the beat pattern correction operator that uses the harmful beat pattern interference to create a correction term. By computing the difference between expected and actual phase information and using this to generate a correction operator, the system converts the harmful wavelength-dependent beat patterns into a useful correction mechanism that restores accurate phase information and eliminates the distortion.
2Volume of stationary object
If coherent combination of images from both sides is performed, then image volume is increased, but beat patterns cause reduced accuracy
Solution Approach 1:
The patent implements feedback by computing the phase information from the second image, comparing it with the expected phase information, and using the difference to generate a correction operator. This correction operator is then applied to the first image to produce the final corrected image, creating a closed-loop feedback mechanism that maintains accuracy while preserving the increased image volume from two-sided imaging.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The proposed method successfully mitigates image beat patterns, improving system resolution and accuracy, particularly in two-sided imaging scenarios, allowing for enhanced visibility of occluded objects and increased image volume.
Implementation Method 1
Active millimeter-wave (mmWave) imaging illuminates a scene with a source of mmWave energy and forms images based on the reflected energy
Implementation Method 2
the two-sided reflection imaging approach can suffer from wavelength dependent beat patterns when coherently combining the images from each side
Data Source
AI summary
The present application is directed to image beat pattern mitigation in two-sided reflection based 3-D millimeter wave imaging. In one example, active millimeter-wave (mmWave) imaging illuminates a scene with a source of mm Wave energy and forms images based on the reflected energy. Two-sided reflection imaging can be used to overcome the occlusion by the opaque objects that would plague a transmission imaging approach. The system can produce beat-pattern-free 3-D images of the products inside an optically-opaque corrugated cardboard shipping box and further, the two-sided reflection imaging approach with image beat pattern correction shows an increased image volume even if portions of the scene are occluded.