Millimeter Wave Scanning Imaging System for Security Inspection

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing active millimeter wave security inspection systems have limitations in throughput due to the need for individuals to stand still for extended periods, requiring multiple devices for simultaneous inspections, which increases cost and space requirements.

Innovation Solution

A scene monitoring type millimeter wave scanning imaging system with a columnar arrangement of millimeter wave scanning devices oriented in different directions, each equipped with a millimeter wave transceiver antenna array and optical cameras, allowing for simultaneous scanning and imaging of multiple individuals from various angles without the need for them to stand still, using a switch matrix to control antenna states and a data processing device for image reconstruction.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a single millimeter wave scanning device is used for security inspection, then the device complexity is reduced, but the productivity decreases due to the need to inspect multiple targets sequentially

Engineering Contradiction:
Improvethroughput rate of security inspectionVSAvoidnumber of millimeter wave scanning devices
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The system divides the inspection area into multiple inspection areas and assigns different millimeter wave scanning imaging devices to each area. Each device is oriented towards a specific orientation and scans objects within its designated inspection area simultaneously, enabling parallel processing of multiple targets without requiring sequential inspection

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system transitions from a single-point inspection approach to a multi-dimensional spatial distribution of scanning devices. By arranging devices at different orientations and positions around the inspection scene, the system enables simultaneous coverage of multiple targets in different spatial locations, effectively increasing throughput without linearly increasing device count

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If multiple millimeter wave scanning devices are deployed to inspect multiple targets simultaneously, then the productivity increases, but the occupying space increases

Engineering Contradiction:
Improvethroughput rate of security inspectionVSAvoidoccupying space of inspection system
Core Design Contradiction:
ProductivityVSArea of stationary object

Solution Approach 1:

Multiple millimeter wave scanning imaging devices are merged into a single integrated system with a shared control unit and data processing unit. This consolidation allows multiple devices to operate simultaneously from different orientations while sharing common control and processing resources, reducing the total space required compared to having separate standalone inspection systems

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The control unit and data processing unit serve multiple inspection devices simultaneously, providing universal functionality. A single control unit manages the operation of all millimeter wave scanning imaging devices, and a single data processing unit processes scan data from all devices, eliminating the need for duplicate control and processing systems for each device

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If individuals stand still for extended periods for inspection, then the measurement precision is improved, but the loss of time increases

Engineering Contradiction:
Improvequality of security inspectionVSAvoidinspection time per target
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system enables continuous scanning and imaging of multiple targets simultaneously without requiring targets to remain stationary for extended periods. By distributing multiple scanning devices across different inspection areas and operating them in parallel, the system maintains continuous inspection coverage while reducing the time each individual needs to stand still, as inspection occurs rapidly and concurrently across multiple devices

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances the throughput rate of security inspections by enabling rapid scanning of multiple individuals from different orientations, reducing inspection time and allowing for improved security monitoring in densely populated areas without the need for extensive equipment or space.

Implementation Method 1

transmitting antenna array 111 and a receiving antenna array 112... the transmitting antenna array 111 includes a plurality of millimeter wave transmitting antennas arranged linearly, and the receiving antenna linear array includes a plurality of millimeter wave receiving antennas arranged linearly

Methodology Applied
Scientific EffectElectromagnetic radiation: Electromagnetic Induction

Data Source

PatentEP3553570B1Millimeter wave scanning imaging system for scene monitoring and security inspection method
Publication Date: 2021.10.06 NUCTECH CO LTD
  • EP3553570B1 patent drawingFigure 1
  • EP3553570B1 patent drawingFigure 2~3A
  • EP3553570B1 patent drawingFigure 3B~4A(d)

AI summary

The disclosure provides a scene monitoring type millimeter wave scanning imaging system, comprising a plurality of millimeter wave scanning imaging devices adapted to be positioned in a security inspection scene, such that the plurality of millimeter wave scanning imaging devices are arranged to be oriented towards different orientations respectively so as to scan and image objects (1) to be inspected located within different inspection areas of the security inspection scene with millimeter waves and to provide scan data for the objects. There is also provided a security inspection method by using the scene monitoring type millimeter wave scanning imaging system.