Mobile Defect Detection with Adaptive Two-Stage Scanning

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Solution Overview

Problem

Existing defect detection systems face a trade-off between accuracy and examination time, where improving accuracy requires reducing the moving speed of the apparatus, increasing the examination time, and increasing speed reduces accuracy due to less collected information.

Innovation Solution

A detection system with a drive control unit that adjusts the traveling speed of a base member based on sensor information, using a first detection unit to identify defect-indicating signs and a second detection unit to perform detailed defect detection, allowing for reduced examination time while maintaining accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the moving speed of the apparatus is reduced to improve defect detection accuracy, then the accuracy is improved, but the examination time increases

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidexamination time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The detection process is segmented into two distinct stages: a first detection stage that operates at higher speed to identify potential defect-indicating signs, and a second detection stage that operates at lower speed to perform detailed defect detection only when signs are detected. This segmentation allows the system to achieve high accuracy where needed while maintaining overall efficiency.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The apparatus dynamically adjusts its moving speed based on detection results. The drive control unit changes the moving speed according to whether defect-indicating signs are detected, allowing the system to optimize between speed and accuracy in real-time during the examination process.

Inventive Principle:
Principle #15Dynamics

2Productivity

If the moving speed of the apparatus is increased to reduce examination time, then the examination time is reduced, but the defect detection accuracy deteriorates

Engineering Contradiction:
Improveexamination efficiencyVSAvoiddefect detection accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The system performs partial detailed detection only in regions where defect-indicating signs are detected, rather than performing full detailed detection across the entire examination area. This partial action approach maintains productivity while ensuring accuracy is achieved where it matters most.

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The examination process is divided into a first detection phase operating at high speed for broad coverage, and a second detection phase operating at low speed for detailed inspection of specific areas of interest, optimizing both productivity and accuracy.

Inventive Principle:
Principle #1Segmentation

3Loss of information

If the apparatus moves slowly to collect more information in detail, then the defect detection accuracy is improved, but the examination time increases

Engineering Contradiction:
Improveinformation collection qualityVSAvoidexamination time
Core Design Contradiction:
Loss of informationVSLoss of time

Solution Approach 1:

Information collection is segmented into two levels: initial information collection at higher speed to identify regions of interest, and detailed information collection at lower speed only in those identified regions, optimizing both information quality and time efficiency.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The information collection process is dynamic, adjusting the level of detail based on detection results. The system collects detailed information only where defect-indicating signs are present, rather than uniformly across all areas, reducing time loss while maintaining information quality where needed.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS11181923B2Detection system, detection method, and program
Publication Date: 2021.11.23 NEC CORP
  • US11181923B2 patent drawing
  • US11181923B2 patent drawing
  • US11181923B2 patent drawing

AI summary

An object of the invention is to provide a new defect detection technique using an autonomously movable apparatus. In order to accomplish the object, the invention provides a detection system (10) including a drive control unit (15) that controls a driving unit (12) causing a base unit (11) to travel in a case where a predetermined detection target is detected on the basis of information collected by a sensor unit (13) installed in the base unit (11), and a second detection unit (16) that detects a predetermined defect on the basis of the information collected by the sensor unit (13).