Mobile Terminal Testing With Adaptive Beam-Selection Wait Times

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Solution Overview

Problem

Existing mobile terminal testing devices face inefficiencies due to the need for a fixed Wait time of 3 seconds for beam selection processes during angle or signal setting changes, which is not optimized and increases measurement time.

Innovation Solution

A mobile terminal testing device with a Wait time analysis control unit that measures signal level changes over time, estimates the beam selection process time based on multiple measurements, and sets an optimized Wait time for future measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a fixed Wait time of 3 seconds is applied for beam selection process during measurement angle or signal setting changes, then the beam selection process is completed reliably, but the overall measurement time increases

Engineering Contradiction:
Improvebeam selection process completionVSAvoidmeasurement time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies dynamics by transitioning from a fixed Wait time to a dynamic, adaptive Wait time that is automatically adjusted based on actual beam selection process measurements. The system measures the actual beam selection time across multiple measurement positions, calculates an appropriate Wait time, and applies this optimized value to subsequent measurements, making the Wait time adaptable to actual system behavior rather than static

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent implements feedback by measuring the actual beam selection process time during measurements, using this measured information to calculate and determine an optimized Wait time, and then applying this determined Wait time to subsequent measurements. This closed-loop feedback mechanism allows the system to self-optimize the Wait time based on actual performance data

Inventive Principle:
Principle #23Feedback

Solution Approach 3:

The patent applies parameter changes by modifying the Wait time parameter from a fixed default value (3 seconds) to an optimized value determined through actual measurement data. The system changes the Wait time parameter based on measured beam selection process times, thereby optimizing the measurement efficiency while maintaining reliability

Inventive Principle:
Principle #35Parameter changes

2Loss of time

If the Wait time is shortened based on known beam selection process time, then the measurement time is reduced, but the method of knowing the beam selection process time is not available

Engineering Contradiction:
Improvemeasurement timeVSAvoidmeasurement method complexity
Core Design Contradiction:
Loss of timeVSDevice complexity

Solution Approach 1:

The patent applies self-service by enabling the measurement system to automatically determine its own optimized Wait time through internal measurements and calculations. The system performs measurements at multiple positions, calculates the actual beam selection time, determines the appropriate Wait time, and applies this to subsequent measurements without requiring external input or complex external measurement methods

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent applies preliminary action by performing initial measurements at multiple measurement positions to determine the beam selection process time before applying the optimized Wait time to subsequent measurements. This preliminary measurement phase enables the system to establish an optimized Wait time that will be used for efficiency in future measurements

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20250258209A1Mobile terminal testing device and mobile terminal testing method
Publication Date: 2025.08.14 ANRITSU CORP
  • US20250258209A1 patent drawing
  • US20250258209A1 patent drawing
  • US20250258209A1 patent drawing

AI summary

There is provided a mobile terminal testing device that can reduce the time required for measurement. A Wait time analysis control unit 18c that performs changes in a plurality of angles, the number of measurements, and signal settings to measure changes in signal level over time a plurality of times, estimates a time for a beam selection process based on the measurement results, obtains a Wait time from the estimated time for the beam selection process, and stores the obtained Wait time to a Wait time management table 16b in association with a corresponding DUT 100 is provided.