Mobile Test Instrument Capability Analysis for LTE and 5G Bands
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Solution Overview
Problem
Assessing the suitability of mobile communication test instruments for various band configurations of devices under test is a time-consuming and expertise-dependent process, especially with the increasing complexity of LTE and 5G New Radio configurations.
Innovation Solution
An automated method and system that receive device under test (DUT) and test instrument parameters to determine suitability, recommending suitable instruments or configurations based on RF, IF, and accelerator units, and providing visualization data for user interface input and control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual assessment of test instrument suitability is performed, then expertise-based accuracy is improved, but time consumption increases
Solution Approach 1:
The test instrument performs self-assessment by automatically comparing its own configuration parameters with the DUT requirements. The instrument retrieves its own capabilities from internal databases and autonomously determines suitability without requiring external expert evaluation, thus reducing time consumption while maintaining accuracy through systematic parameter matching.
Solution Approach 2:
The patent replaces the manual expert assessment process with an automated computer-based system. The analysis circuit electronically compares test instrument parameters against DUT configuration requirements, substituting human expertise with algorithmic evaluation that achieves comparable or superior accuracy while dramatically reducing time consumption.
2Adaptability or versatility
If manual assessment of test instrument suitability is performed, then flexibility in handling complex configurations is improved, but user expertise requirement increases
Solution Approach 1:
The test instrument autonomously evaluates its capability to handle various DUT configurations by retrieving its own parameter information from internal databases and comparing it against requirements. This self-assessment mechanism provides flexibility in handling complex configurations without requiring users to possess specialized knowledge, as the instrument performs the evaluation independently.
Solution Approach 2:
The patent introduces an automated analysis system as an intermediary between the user and the complex technical evaluation process. This intermediary handles the complexity of parameter matching and suitability determination, allowing users to obtain accurate assessments without needing to understand the underlying technical complexities or possess domain expertise.
3Loss of time
If automated analysis is implemented, then time consumption is reduced, but system complexity increases
Solution Approach 1:
The automated analysis system is designed as a universal platform that can assess multiple test instruments across various DUT configurations using a single integrated approach. The system handles diverse parameter types (RF units, IF units, accelerator units, memory configurations) through unified databases and comparison algorithms, reducing overall system complexity despite the variety of functions performed.
Solution Approach 2:
The patent introduces an automated analysis system as an intermediary between the user and the complex technical evaluation process. This intermediary handles the complexity of parameter matching and suitability determination, allowing users to obtain accurate assessments without needing to understand the underlying technical complexities or possess domain expertise.
4Measurement precision
If comprehensive parameter comparison is performed, then assessment accuracy is improved, but computational requirements increase
Solution Approach 1:
The system extracts only the essential parameters needed for suitability determination from comprehensive instrument specifications and DUT requirements. By identifying and comparing only the critical parameters (such as RF unit counts, IF unit capabilities, accelerator unit specifications) rather than all possible parameters, the system maintains high assessment accuracy while reducing computational energy requirements.
Data Source
AI summary
A method of analyzing test capabilities of a mobile communication test instrument is described. The method includes the steps of: receiving device under test (DUT) parameters being associated with a device under test, wherein the DUT parameters comprise information on a subset of band configurations associated with a device under test, wherein the subset of band configurations is to be tested; receiving, from an instrument database, test instrument parameters being associated with the test instrument, wherein the test instrument parameters comprise information on features of the test instrument; and determining, by an analysis circuit, whether the test instrument is suitable for testing the device under test based on the DUT parameters and based on the test instrument parameters. Further, a computer program product embodied on a non-transitory computer-readable medium and an analysis system for analyzing test capabilities of a mobile communication test instrument are described.