Modular DUT Testing Module with Universal Receptacle
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Solution Overview
Problem
Existing device testing methodologies are product-centric or equipment-centric, limiting flexibility and requiring separate testing setups for different devices and conditions, which is inefficient and costly.
Innovation Solution
An individualized automated testing environment is established using DUT receptacles with uniform size and interfaces, combined with modular testers and test floor equipment, allowing for various device types, test types, and conditions to be accommodated within a single testing system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a product-centric testing solution is used, then testing is optimized for a specific product, but the testing setup cannot efficiently test different product types
Solution Approach 1:
The testing system employs a universal fixture design that can accommodate multiple product types through interchangeable adapters and configurable test modules. The fixture includes standardized interfaces and modular components that allow the same base system to test different devices, resolving the contradiction between optimization for specific products and flexibility for different product types.
2Reliability
If separate testing setups are developed for different products, then each product receives customized testing, but the overall system complexity and cost increase
Solution Approach 1:
The testing system is divided into modular segments including standardized fixtures, interchangeable adapters, and configurable test modules. Each module can be independently selected and configured for specific testing needs, allowing customized testing quality without requiring entirely separate testing setups for different products.
Solution Approach 2:
A universal base fixture design serves multiple product types through configurable modules and adapters, reducing the total number of testing setups while maintaining specialized testing capabilities for each product type through modular additions rather than complete separate systems.
3Ease of manufacture
If equipment-centric testing is used, then specific testing equipment forms the foundation, but the limitations of the equipment constrain the testing capabilities
Solution Approach 1:
The testing system incorporates dynamically configurable elements including programmable test modules, adjustable fixtures, and software-configurable parameters that allow the equipment to adapt its capabilities beyond fixed hardware limitations. The system can be reconfigured through software and module changes to expand testing capabilities while maintaining a stable equipment foundation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables flexible and efficient testing of diverse devices under different conditions without the need for multiple testing setups, reducing costs and improving testing efficiency.
Implementation Method 1
a first air flow interface operable to deliver a controlled air flow to an interior of the first DUT receptacle
Implementation Method 2
a first temperature sensor located inside the first DUT receptacle and operable to measure a temperature inside the first DUT receptacle
Data Source
AI summary
In an embodiment, a testing system includes a frame, a DUT (device under test) testing module. The frame has at least one aperture extending from a front side of the frame to a rear side of the frame. The DUT testing module is inserted into the at least one aperture. The DUT testing module is operable to receive and hold a DUT receptacle including an electrical interface, an air flow interface, and a DUT coupled to the electrical interface. The DUT receptacle is configured to enclose and hold inside the DUT. Further, the DUT testing module is operable to couple to and to use the electrical interface and the air flow interface to perform a test at a controlled temperature on the DUT that is inside of the DUT receptacle.