Modular Electronic Component Tester with Vacuum Adsorption
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Solution Overview
Problem
Traditional electronic component testing apparatuses are complex and costly, making them inefficient for qualifying electronic components for effective circuit performance.
Innovation Solution
A simplified electronic component testing apparatus with a modular structure comprising a base, screw rod, sliding portions, connecting portions, adsorption structure, and probes, allowing for precise alignment and testing of components with adjustable positions and sizes, and easy manufacturing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional test institution structure is used, then electronic component testing can be performed, but the structure is relatively complicated and the cost is relatively high
Solution Approach 1:
The testing apparatus is divided into independent functional modules: a base, a movable platform with adsorption structure for component holding, and separate probe structures. Each module can be independently positioned and adjusted, allowing the system to maintain testing capability while reducing overall structural complexity through modular design.
Solution Approach 2:
The movable platform with adsorption structure can hold different electronic components through vacuum adsorption, and the probe structure can test various component types (resistors, capacitors, LEDs, etc.). This multi-functional design allows a single simplified apparatus to perform multiple testing functions, reducing the need for separate specialized testing equipment for each component type.
2Reliability
If traditional test institution structure is used, then electronic component testing can be performed, but the cost is relatively high
Solution Approach 1:
By segmenting the testing apparatus into simple modular components (base, movable platform, adsorption structure, probes), each part can be manufactured independently using standard fabrication processes, reducing overall manufacturing cost while maintaining testing reliability.
Solution Approach 2:
The design uses simple, easily replaceable components such as the probe structure and adsorption elements. These can be manufactured at low cost and replaced if needed, reducing the overall system cost while ensuring continuous testing capability.
3Device complexity
If fixed testing apparatus is used, then structure is simple, but cannot accommodate electronic components of various sizes
Solution Approach 1:
The platform is designed to be movable relative to the base, and the adsorption structure can adjust its position to accommodate electronic components of various sizes. This dynamic positioning capability allows the simple apparatus structure to adapt to different component dimensions while maintaining structural simplicity.
Solution Approach 2:
The adsorption structure using vacuum adsorption can securely hold different types and sizes of electronic components on the movable platform. This universal holding mechanism allows the apparatus to test various component sizes without requiring multiple specialized fixtures, maintaining structural simplicity while enhancing versatility.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus enables efficient, cost-effective testing of electronic components of various sizes, simplifying the testing process and reducing costs while ensuring accurate performance qualification.
Implementation Method 1
the adsorption structure (60) is used to fix an electronic component (200) on the measuring platform (90)
Data Source
AI summary
An apparatus for testing electronic components includes a base, a screw rod structure, a first sliding portion, a second sliding portion, a vacuum-based or similar adsorption structure, and a probe. The screw rod structure is fixedly connected to one side of the base. The first sliding portion is slidably positioned on the screw rod structure. The second sliding portion is slidably positioned on the first sliding portion. The adsorption structure is arranged on the second sliding portion. The adsorption structure gathers and holds an electronic component. The probe and the electronic component are arranged to correspond. The probe is electrically connected to a test device. The test device tests the electronic component through the probe.