Modular Plate Connection System for Semiconductor Test Units
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Solution Overview
Problem
Existing connection systems for test units, such as testing devices and handling devices in semiconductor testing systems, lack flexibility and cost-effectiveness in accommodating various semiconductor elements and test unit geometries, limiting their ability to easily connect and test different types of semiconductor elements.
Innovation Solution
A plate-shaped connection system comprising a master frame with docking elements for releasable connection and an insert frame with mounting elements for test boards, allowing for adjustable distance settings and multiple insert frame configurations to accommodate varying test board geometries, enabling easy switching between different semiconductor elements and test units.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a single rigid connection system is used for all test units, then structural stability is maintained, but flexibility and adaptability to different semiconductor elements are reduced
Solution Approach 1:
The connection system is divided into a master frame and multiple interchangeable insert frames. Each insert frame is designed for specific semiconductor element geometries, allowing the system to adapt to different elements without redesigning the entire connection structure. This segmentation enables modular adaptation while maintaining overall system stability.
Solution Approach 2:
The master frame serves as a universal base structure that can accommodate multiple types of insert frames through standardized connection interfaces. This multi-functionality allows a single master frame to support various semiconductor element types by simply changing the insert frame, achieving versatility without proportional increase in overall system complexity.
2Adaptability or versatility
If multiple specialized connection systems are designed for different semiconductor elements, then adaptability is improved, but manufacturing cost and device complexity increase
Solution Approach 1:
By segmenting the connection system into a reusable master frame and interchangeable insert frames, the patent enables separate manufacturing optimization. The master frame can be manufactured once at high volume, while insert frames can be manufactured more economically in smaller batches for specific element types, reducing overall manufacturing costs compared to producing multiple complete specialized systems.
Solution Approach 2:
The patent merges the common functional elements (master frame with docking elements, connection mechanisms) into a single shared structure that serves all semiconductor element types. Only the element-specific portions (insert frames with mounting elements) are differentiated, allowing economies of scale in manufacturing the shared components while maintaining adaptability.
3Adaptability or versatility
If test boards with varying geometries are used for different semiconductor elements, then testing versatility is improved, but the complexity of mounting and alignment increases
Solution Approach 1:
Each insert frame is designed with local quality optimized for specific test board geometries, featuring mounting elements positioned and configured for particular semiconductor element types. The standardized connection interface between insert frames and master frame maintains uniform operation procedures, allowing operators to switch between different element types by simply changing insert frames rather than learning multiple mounting procedures.
Data Source
AI summary
The present invention relates to a plate-shaped connection system for the connection of two test units, such as for example a testing device (tester) and a handling device (handler). The handling device serves for the feeding of semiconductor elements to the tester of a test system, for the testing of such semiconductor elements. The plate-shaped connection system comprises a master frame and an insert frame. The master frame is designed for connection with a first of the two test units and one or more docking elements are provided for releasable connection with the other second test unit. The insert frame is designed that it may be connected to the master frame. The insert frame extends inwards from an inner edge of the master frame, wherein the insert frame has mounting elements for the mounting of a test board.