Modular Probe Card With Replaceable Cantilever Needle Assemblies
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Solution Overview
Problem
Conventional probe cards require replacement when a majority of needles are damaged, leading to inefficient resource use and increased costs, as users cannot change only the damaged needles.
Innovation Solution
A probe card design with independently assembled and disassembled probe assemblies, allowing for the replacement of damaged components without replacing the entire card, featuring cantilever needles and a modular structure for easy maintenance and reuse.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the entire probe card is replaced when needles are damaged, then testing functionality is restored, but resource efficiency decreases and costs increase
Solution Approach 1:
The probe card is divided into multiple independent probe assemblies (first probe assembly and second probe assembly) that can be separately replaced. Each probe assembly contains a subset of needles, allowing selective replacement of only the damaged portion rather than the entire card, thus improving resource efficiency while maintaining testing functionality.
2Ease of manufacture
If all needles are disposed from low to high on a single probe assembly, then manufacturing is simplified, but repairability deteriorates when needles are damaged
Solution Approach 1:
The probe assemblies are separated into multiple independent units (first and second probe assemblies), each maintaining the simplified low-to-high needle arrangement for ease of manufacture. When repair is needed, only the specific damaged probe assembly needs to be replaced, not all needles across the entire card, thus improving repairability while preserving manufacturing simplicity.
3Ease of repair
If a modular probe assembly structure is implemented, then repairability improves, but device complexity increases
Solution Approach 1:
The probe card is segmented into modular probe assemblies that are independently fabricatable and replaceable. The modular structure uses standardized interfaces and mounting methods, which reduces the operational complexity of replacement procedures. While the overall device has multiple components, the modularity simplifies maintenance and repair processes, offsetting the increased structural complexity.
Data Source
AI summary
A probe card includes a circuit board and an integrated circuit (IC) test interface. The IC test interface includes a first probe assembly, disposed on a terminal of the circuit board, and a second probe assembly, disposed on another terminal of the circuit board, wherein the first probe assembly and the second probe assembly are separated to allow being independently assembled to, or disassembled from, the circuit board. Each of the first probe assembly and the second probe assembly includes a probe base, disposed on the circuit board; a plurality of needles, which are cantilever needles; and a covering layer, for covering the plurality of needles, and fixed on a surface of the probe base.