Modular Probe System With Quick-Release Connectors

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional probe systems lack flexibility and upgradeability, requiring separate systems for different sizes and scientific fields, which is costly and time-consuming, especially for smaller businesses and academic institutions with limited budgets.

Innovation Solution

A modular probe system with a mounting interface and quick-release connectors allows for rapid replacement and reconfiguration of components, enabling the same system to test various devices and materials across different scientific fields within 60 minutes using hand tools.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional probe systems are designed for specific test applications, then testing precision and reliability are improved, but adaptability and versatility deteriorate

Engineering Contradiction:
Improvetesting precisionVSAvoidadaptability
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The probe system is divided into modular components (probe cards, manipulators, stages, chucks) that can be independently selected and combined. Each module can be quickly swapped without affecting other components, allowing the system to maintain high precision for specific tests while adapting to different test applications through component reconfiguration.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The standardized mounting interfaces and quick-release connectors create a universal platform that can accommodate multiple types of probe cards, manipulators, and test fixtures. This universal design enables a single system to perform diverse testing functions across different scientific fields without requiring separate dedicated systems.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If dedicated probe systems are purchased for different scientific fields, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system merges multiple testing capabilities into a single integrated platform by providing standardized interfaces that accommodate various probe cards, manipulators, and test fixtures. This consolidation allows users to perform semiconductor testing, life sciences analysis, and other applications on one system rather than maintaining separate dedicated systems.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The universal mounting interfaces and quick-release connector design enable a single probe system to function across multiple scientific fields and application types, eliminating the need for multiple specialized systems and reducing overall device complexity while maintaining measurement precision through application-specific component selection.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Adaptability or versatility

If probe systems are customized for specific applications, then adaptability is improved, but ease of manufacture and installation deteriorate

Engineering Contradiction:
ImproveadaptabilityVSAvoidease of installation
Core Design Contradiction:
Adaptability or versatilityVSEase of manufacture

Solution Approach 1:

The system incorporates pre-engineered standardized mounting interfaces and quick-release connectors that are built into each component during manufacturing. This preliminary preparation of connection mechanisms allows for rapid field assembly and reconfiguration without requiring complex installation procedures or specialized tooling, making the system both adaptable and easy to install.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS7764079B1Modular probe system
Publication Date: 2010.07.27 SEMIPROBE
  • US7764079B1 patent drawing
  • US7764079B1 patent drawing
  • US7764079B1 patent drawing

AI summary

A modular probe system that includes components that are selected to test different devices-under-test (DUTs) in a number of different scientific fields. The system includes quick-release connectors that may be used to releasably secure components of the modular probe system to one another or to a mounting interface. These connectors permit quick and easy attachment and detachment of various components in a manner that permits a user to readily configure the probe system for each DUT.