Modular Test Bench for Power Electronic Blocks
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Solution Overview
Problem
Existing test systems for electronic power blocks typically test complete devices, making it difficult to identify defects in sub-assemblies and can lead to damage if one sub-assembly fails, and the testing process is often lengthy due to its complexity.
Innovation Solution
A modular test bench with four IGBT-type bridge arms and adjustable inductance connections, allowing for testing of individual modules or combinations, enabling flexible configuration to suit various power block configurations, including single, H-bridge, or three-phase devices, with manual or automated interface modifications to adapt to different current calibers.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If complete devices are tested using existing test systems, then the testing covers the entire product functionality, but defect identification becomes slower and more complicated due to system complexity
Solution Approach 1:
The test system is segmented into modular test units, each capable of testing specific sub-assemblies or functional blocks independently. This allows testers to isolate and identify defects in particular modules without having to analyze the entire complex system, thereby reducing defect identification time while maintaining comprehensive testing coverage.
2Reliability
If complete devices are tested, then all product functions are validated, but the failure of one sub-assembly can affect or damage the entire product
Solution Approach 1:
By dividing the testing into independent modular units, each sub-assembly can be tested in isolation with appropriate protection measures. If a sub-assembly fails during testing, the damage is contained to that specific module rather than propagating to the entire product, thus reducing the harmful effects while maintaining comprehensive validation.
Solution Approach 2:
The test system incorporates protective measures and isolation mechanisms beforehand to prevent damage propagation. Each modular test unit is designed with appropriate shielding and isolation so that failures in one unit do not affect other units or the main product, cushioning against potential harm before it can spread.
3Device complexity
If fixed configuration test benches are used, then the testing setup is simple, but the system cannot adapt to different power block configurations with varying current calibers
Solution Approach 1:
The test bench employs dynamic, reconfigurable connections that can be adjusted to match different power block configurations. The system allows for changing current calibers and connection topologies (such as H-bridge or three-phase configurations) by reconfiguring the modular test units, maintaining relatively simple individual components while achieving high overall adaptability.
Solution Approach 2:
The modular test units are designed with universal interfaces and standardized connection methods that can accommodate various power block types and configurations. Each module can be configured for different current calibers and connection schemes, allowing a single test bench to serve multiple testing purposes without requiring completely different setups for each configuration.
Data Source
Figure 1
Figure 2~3
AI summary
The bench (1) has four bridge arms (11-14) decoupled in pairs by two capacitors (C1, C2). Each arm includes a pair of insulated gate bipolar transistor (IGBT) type power transistors protected by a diode. Each arm is connected to one of four inductors (21-24) connected in series at an output of the arm. A connection interface connects the bench to electronic power units (2-4). The connection interface includes a connection unit (5) to modify the coupling of the inductors.