Modular Test Board for Storage Device Signal Integrity
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Solution Overview
Problem
Current test substrates lack reliability in vertically combining with storage devices and ensuring effective communication and analysis signals between storage devices and hosts, leading to potential noise interference and signal loss.
Innovation Solution
A test board design featuring a main board with a storage device connector for vertical combination, an analysis signal output terminal for testing, and a host connector, along with detachable sub-boards that adjust according to the storage device's form factor, reducing noise through ground terminals and maintaining signal integrity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a fixed-size test board is used, then the structure is simple, but it cannot adapt to different storage device form factors
Solution Approach 1:
The test board is divided into a main board and multiple detachable sub-boards. The main board contains core components and connectors, while sub-boards can be selectively attached to match different storage device form factors (e.g., 2.5-inch, 1.8-inch). This segmentation allows the test board to adapt to various device sizes without redesigning the entire structure.
Solution Approach 2:
The test board employs a dynamic configuration where sub-boards can be detachably connected or disconnected from the main board. This dynamic structure enables the test board to change its effective size and shape according to the storage device being tested, providing versatility without permanent complexity.
2Reliability
If vertically combining test board with storage device, then connection is established, but noise interference and signal loss occur
Solution Approach 1:
The test board acts as an intermediary device between the storage device and the host. It includes signal conditioning circuits, filtering components, and impedance matching networks that clean up and stabilize signals during transmission. The analysis signal output terminal provides isolated test points that prevent noise from affecting the main signal path.
Solution Approach 2:
The test board extracts and separates test and analysis signals from the main data transmission path. By providing dedicated analysis signal output terminals that tap into specific signal lines, the system can monitor and analyze signals without interfering with the primary data flow, thereby reducing noise and maintaining signal integrity.
3Measurement precision
If multiple signal lines are used for testing, then comprehensive testing is enabled, but signal interference increases
Solution Approach 1:
The test board implements local quality control by providing dedicated analysis signal output terminals for different signal lines (e.g., separate terminals for data lines, command lines, and status lines). Each terminal is optimally positioned and designed to handle specific signal types, reducing cross-interference while enabling comprehensive testing of all signal pathways.
Data Source
AI summary
The present disclosure relates to an electronic device. A test board having improved reliability according to the present disclosure includes a main board, a storage device connector positioned at an upper section of the main board and configured to vertically combine the main board and a storage device with each other, an analysis signal output terminal positioned at the upper section of the main board and configured to output an analysis signal for testing the storage device or communication between the storage device and a host, a host connector connected to a first side section of the main board and configured to combine the main board and the host with each other; and a first sub board detachably connected to a second side section of the main board.